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Mestres, Narcís

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Firma en Digital.CSIC (*)
Mestres, Narcís
 
Centro o Instituto
CSIC - Instituto de Ciencia de Materiales de Barcelona (ICMAB)
 
Departamento
Superconducting Materials and Nanostructure at Large Scale
 
Especialización
My research is focused on the synthesis of advanced materials with controlled microstructure and the search for the comprehension of the physical mechanisms underlying their functional properties. I have addressed the growth and study of thin films and nanostructures of functional oxides with potential impact in electronics, energy saving and environmental science.
 
Email
narcis.mestres@icmab.es
 
ORCID
 
Perfil en Google Scholar
 
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Scopus AuthorID
 
Otros - ResearchGate
 
Otros identificadores (con url)
 

Publications

Refined By:
Autor:  Vellvehi Hernández, Miquel

Resultados 1-8 de 8.

DerechosPreviewFecha Public.TítuloAutor(es)Tipo
1openAccessARTICULOS13790[1].pdf.jpgmay-2010Analysis of Excess Carrier Concentration Control in Fast-Recovery High Power Bipolar Diodes at Low Current DensitiesPerpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Vobecky, J.; Mestres, Narcís CSIC ORCID artículo
2closedAccessoct-2008Hot-Spot Detection in Integrated Circuits by Substrate Heat-Flux SensingPerpiñà, X.; Altet, J.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID artículo
3closedAccess2004Internal infrared laser deflection system: a tool for power device characterizationPerpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, José; Kiedrowski, H. vonartículo
4closedAccessene-2009Laser beam deflection-based perimeter scanning of integrated circuits for local overheating locationPerpiñà, X.; Jordà, Xavier; Altet, J.; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID artículo
5closedAccessoct-2004Self-heating experimental study of 600 V PT-IGBTs under low dissipation energiesPerpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, Joséartículo
6closedAccessago-2008Steady-state sinusoidal thermal characterization at chip level by internal infrared-laser deflectionPerpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Altet, J.; Mestres, Narcís CSIC ORCID artículo
7openAccesshttp___scitation.aip.org&doi=10.1063_1.pdf.jpgsep-2005Thermal calibration procedure for internal infrared laser deflection apparatusPerpiñà, X.; Jordà, Xavier; Madrid, Francesc CSIC; Flores, David; Hidalgo, Salvador ; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID artículo
8closedAccessdic-2006Transmission Fabry–Pérot interference thermometry for thermal characterization of microelectronic devicesPerpiñà, X.; Jordà, Xavier; Madrid, Francesc CSIC; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID artículo