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Navegación por Autor Staufer, Urs
Mostrando resultados 1 a 5 de 5
Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
closedAccess | | 2015 | Continuous monitoring of tip radius during atomic force microscopy imaging | Fraxedas, J. CSIC ORCID ; Perez Murano, Francesc X. CSIC ORCID ; Gramazio, Federico CSIC; Lorenzoni, Matteo; Rull, Enrique; Staufer, Urs | comunicación de congreso |
closedAccess | | 2016 | Continuous tip monitoring and sensing of surface mechanical properties during Atomic Force Microscopy imaging using higher harmonics | Gramazio, Federico CSIC; Fraxedas, J. CSIC ORCID ; Lorenzoni, Matteo; Perez Murano, Francesc X. CSIC ORCID ; Rull, Enrique; Staufer, Urs | comunicación de congreso |
openAccess | | 2015 | In-situ monitoring of the Atomic Force Microscopy (AFM) tip by analysing the cantilever’s higher harmonic vibrations | Rull, Enrique; Staufer, Urs | presentación |
openAccess | | 12-oct-2016 | Method for monitoring radius and shape variations of atomic force microscope cantilever tips and device thereof | Fraxedas, J. CSIC ORCID ; Perez Murano, Francesc X. CSIC ORCID ; Staufer, Urs; Rull, Enrique | solicitud de patente |
openAccess | | 13-oct-2016 | Method for monitoring radius and shape variations of atomic force microscope cantilever tips and device thereof | Fraxedas, J. CSIC ORCID ; Perez Murano, Francesc X. CSIC ORCID ; Staufer, Urs; Rull, Enrique | solicitud de patente |