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Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
closedAccess | | 2008 | A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits | Altet, J.; Aldrete Vidrio, E.; Mateo, D.; Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Salhi, A.; Grauby, Stéphane; Claeys, W.; Dilhaire, S. | artículo |
closedAccess | | 2010 | Analysis and optimization of safe-operating-area of LUDMOS transistors based on 0.18 µm SOI CMOS technology | Cortés, Ignasi; Toulon, G.; Morancho, F.; Urresti, J.; Perpiñà, X.; Villard, B. | artículo |
closedAccess | | jul-2011 | Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions | Perpiñà, X.; Serviere, J. F.; Urresti, J.; Cortés, Ignasi; Jordà, Xavier; Hidalgo, Salvador ; Rebollo, J.; Mermet-Guyennet, M. | artículo |
openAccess | | may-2010 | Analysis of Excess Carrier Concentration Control in Fast-Recovery High Power Bipolar Diodes at Low Current Densities | Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Vobecky, J.; Mestres, Narcís CSIC ORCID | artículo |
openAccess | | 26-ene-2021 | BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits | Altet, Josep; Barajas, Enrique; Mateo, Diego; Billong, Alexandre; Aragonés, Xavier; Perpiñà, X.; Reverter, Ferran | artículo |
openAccess | | 25-jul-2020 | Conjunto de máscaras metálicas auto alineadas para depositar, de modo selectivo, capas finas sobre dispositivos y substratos microelectrónicos y método de empleo | Jordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; Sánchez, David CSIC ORCID ; Godignon, Philippe | traducción de patente |
openAccess | | 2005 | Development of an analog processing circuit for IR-radiation power and noncontact position measurements | Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José | artículo |
closedAccess | | 2007 | Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities | Perpiñà, X.; Castellazzi, A.; Pitón, M.; Mermet-Guyennet, M.; Millán, José | artículo |
openAccess | | 2009 | GaN metal-oxide-semiconductor field-effect transistor inversion channel mobility modeling | Pérez-Tomás, A.; Placidi, A.; Perpiñà, X.; Constant, A.; Godignon, Philippe; Jordà, Xavier; Brosselard, P.; Millán, José | artículo |
openAccess | | dic-2004 | Heat power source controller circuit | Madrid, Francesc CSIC; Jordà, Xavier; Vellvehi Hernández, Miquel; Perpiñà, X.; Godignon, Philippe | artículo |
openAccess | | 2-feb-2009 | Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization | Altet, J.; Aldrete Vidrio, E.; Mateo, D.; Salhi, A.; Grauby, Stéphane; Claeys, W.; Dilhaire, S.; Perpiñà, X.; Jordà, Xavier | artículo |
openAccess | | 2011 | Hot spot analysis in integrated circuit substrates by laser mirage effect | Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Altet, J. | artículo |
closedAccess | | oct-2008 | Hot-Spot Detection in Integrated Circuits by Substrate Heat-Flux Sensing | Perpiñà, X.; Altet, J.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID | artículo |
closedAccess | | 2008 | IGBT module failure analysis in railway applications | Perpiñà, X.; Serviere, J. F.; Jordà, Xavier; Fauquet, A.; Hidalgo, Salvador ; Urresti, J.; Rebollo, J.; Mermet-Guyennet, M. | artículo |
closedAccess | | 2004 | Internal infrared laser deflection system: a tool for power device characterization | Perpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, José; Kiedrowski, H. von | artículo |
closedAccess | | ene-2009 | Laser beam deflection-based perimeter scanning of integrated circuits for local overheating location | Perpiñà, X.; Jordà, Xavier; Altet, J.; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID | artículo |
closedAccess | | 2007 | Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles | Perpiñà, X.; Pitón, M.; Mermet-Guyennet, M.; Jordà, Xavier; Millán, José | artículo |
closedAccess | | jul-2011 | Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems | Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Rebollo, J.; Mermet-Guyennet, M. | artículo |
openAccess | | 14-jul-2016 | Method for the functional analysis of wirelessly fed semiconductors | León Cerro, Javier; Perpiñà, X.; Vellvehi Hernández, Miquel; Jordà, Xavier | solicitud de patente |
closedAccess | | dic-2008 | Power-Substrate Static Thermal Characterization Based on a Test Chip | Jordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; Coleto, J. | artículo |