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RightsPreviewIssue DateTitleAuthor(s)Type
closedAccess2008A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuitsAltet, J.; Aldrete Vidrio, E.; Mateo, D.; Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Salhi, A.; Grauby, Stéphane; Claeys, W.; Dilhaire, S.artículo
closedAccess2010Analysis and optimization of safe-operating-area of LUDMOS transistors based on 0.18 µm SOI CMOS technologyCortés, Ignasi; Toulon, G.; Morancho, F.; Urresti, J.; Perpiñà, X.; Villard, B.artículo
closedAccessJul-2011Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload ConditionsPerpiñà, X.; Serviere, J. F.; Urresti, J.; Cortés, Ignasi; Jordà, Xavier; Hidalgo, Salvador ; Rebollo, J.; Mermet-Guyennet, M.artículo
openAccessARTICULOS13790[1].pdf.jpgMay-2010Analysis of Excess Carrier Concentration Control in Fast-Recovery High Power Bipolar Diodes at Low Current DensitiesPerpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Vobecky, J.; Mestres, Narcís CSIC ORCID artículo
openAccessBPF-Based_Altet_PV_Art2021.pdf.jpg26-Jan-2021BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF CircuitsAltet, Josep; Barajas, Enrique; Mateo, Diego; Billong, Alexandre; Aragonés, Xavier; Perpiñà, X.; Reverter, Ferranartículo
openAccessES2769265T3.pdf.jpg25-Jul-2020Conjunto de máscaras metálicas auto alineadas para depositar, de modo selectivo, capas finas sobre dispositivos y substratos microelectrónicos y método de empleoJordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; Sánchez, David CSIC ORCID ; Godignon, Philippetraducción de patente
openAccessARTICULOS13057[1].pdf.jpg2005Development of an analog processing circuit for IR-radiation power and noncontact position measurementsPerpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, Joséartículo
closedAccess2007Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneitiesPerpiñà, X.; Castellazzi, A.; Pitón, M.; Mermet-Guyennet, M.; Millán, Joséartículo
openAccessARTICULOS13303[1].pdf.jpg2009GaN metal-oxide-semiconductor field-effect transistor inversion channel mobility modelingPérez-Tomás, A.; Placidi, A.; Perpiñà, X.; Constant, A.; Godignon, Philippe; Jordà, Xavier; Brosselard, P.; Millán, Joséartículo
openAccessARTICULOS13282[1].pdf.jpgDec-2004Heat power source controller circuitMadrid, Francesc CSIC; Jordà, Xavier; Vellvehi Hernández, Miquel; Perpiñà, X.; Godignon, Philippeartículo
openAccessGetPDFServlet.pdf.jpg2-Feb-2009Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterizationAltet, J.; Aldrete Vidrio, E.; Mateo, D.; Salhi, A.; Grauby, Stéphane; Claeys, W.; Dilhaire, S.; Perpiñà, X.; Jordà, Xavierartículo
openAccessARTICULOS315585[1].pdf.jpg2011Hot spot analysis in integrated circuit substrates by laser mirage effectPerpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Altet, J.artículo
closedAccessOct-2008Hot-Spot Detection in Integrated Circuits by Substrate Heat-Flux SensingPerpiñà, X.; Altet, J.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID artículo
closedAccess2008IGBT module failure analysis in railway applicationsPerpiñà, X.; Serviere, J. F.; Jordà, Xavier; Fauquet, A.; Hidalgo, Salvador ; Urresti, J.; Rebollo, J.; Mermet-Guyennet, M.artículo
closedAccess2004Internal infrared laser deflection system: a tool for power device characterizationPerpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, José; Kiedrowski, H. vonartículo
closedAccessJan-2009Laser beam deflection-based perimeter scanning of integrated circuits for local overheating locationPerpiñà, X.; Jordà, Xavier; Altet, J.; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID artículo
closedAccess2007Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profilesPerpiñà, X.; Pitón, M.; Mermet-Guyennet, M.; Jordà, Xavier; Millán, Joséartículo
closedAccessJul-2011Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based SystemsPerpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Rebollo, J.; Mermet-Guyennet, M.artículo
openAccessWO2016110607A1.pdf.jpg14-Jul-2016Method for the functional analysis of wirelessly fed semiconductorsLeón Cerro, Javier; Perpiñà, X.; Vellvehi Hernández, Miquel; Jordà, Xaviersolicitud de patente
closedAccessrestringido.pdf.jpgDec-2008Power-Substrate Static Thermal Characterization Based on a Test ChipJordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; Coleto, J.artículo