| Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
| openAccess | | 22-may-2019 | A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices | Pedreira, G.; Martin-Martinez, J.; Diaz-Fortuny, J.; Saraza-Canflanca, P. CSIC ORCID; Rodriguez, R.; Castro-López, R. CSIC ORCID ; Roca, E.; Fernandez, F. V.; Nafria, M. | Conference Paper |
| openAccess | | 1-jul-2019 | An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks | Martin-Lloret, P.; Nuñez, J.; Roca, E.; Castro-López, R. CSIC ORCID ; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | Conference Paper |
| openAccess | | 1-jul-2019 | Experimental Characterization of Time-Dependent Variability in Ring Oscillators | Nuñez, J.; Roca, E.; Castro-López, R. CSIC ORCID ; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | Conference Paper |
| openAccess | | 14-may-2019 | Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator | Toro-Frias, A. CSIC; Saraza-Canflanca, P. CSIC ORCID; Passos, F.; Martin-Lloret, P.; Castro-López, R. CSIC ORCID ; Roca, E.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | Conference Paper |
| openAccess | | 14-may-2019 | New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors | Saraza-Canflanca, P. CSIC ORCID; Diaz-Fortuny, J.; Castro-López, R. CSIC ORCID ; Roca, E.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | Conference Paper |
| openAccess | | 1-jul-2019 | TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level | Saraza-Canflanca, P. CSIC ORCID; Diaz-Fortuny, J.; Castro-López, R. CSIC ORCID ; Roca, E.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | Conference Paper |
