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Navegación por Autor Martín-Lloret, P.
Mostrando resultados 1 a 5 de 5
| Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
| closedAccess |  | 2017 | A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs | Martín-Lloret, P. CSIC; Toro-Frias, A. CSIC; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
| openAccess |  | 11-jul-2022 | Characterization and analysis of BTI and HCI effects in CMOS current mirrors | Santana-Andreo, A. CSIC ORCID; Martín-Lloret, P. CSIC; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
| openAccess |  | 22-sep-2022 | Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures | Santana-Andreo, A. CSIC ORCID; Martín-Lloret, P. CSIC; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
| openAccess |  | 19-abr-2021 | Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblock | Nafria, M.; Diaz-Fortuny, J.; Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Martín-Lloret, P. CSIC; Toro-Frias, A. CSIC; Mateo, D.; Barajas, E.; Aragones, X.; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
| closedAccess |  | sep-2016 | Reliability simulation for analog ICs: Goals, solutions, and challenges | Toro-Frias, A. CSIC; Martín-Lloret, P. CSIC; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
