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Browsing by Author González, M. B.

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openAccessManuscript_#SSE-D-11-00531_revised_version_with_all_changes_accepted_vfinal.pdf.jpg20132 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O <inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectricsRafí, J.M. CSIC ORCID ; Campabadal, Francesca; Ohyama, H.; Takakura, K.; Tsunoda, I.; Zabala, Miguel; Beldarrain, O.; González, M. B.; García, H.; Castán, H.; Gómez, A.; Dueñas, S.artículo
openAccessMR-D-13-00242R1-2_pagines_rellevants.pdf.jpg20132 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al<inf>2</inf>O<inf>3</inf> dielectrics of different thicknessRafí, J.M. CSIC ORCID ; González, M. B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Beldarrain, O.; Zabala, Miguel; Campabadal, Francescaartículo
openAccesssse_mpedro.pdf.jpg2019A flexible characterization methodology of RRAM: Application to the modeling of the conductivity changes as synaptic weight updatesPedro, M.; Martín-Martínez, Javier; Rodriguez, R.; González, M. B.; Campabadal, Francesca; Nafría, Montserratartículo
openAccessme_gonzalez-cordero.pdf.jpg2019A new technique to analyze RTN signals in resistive memoriesGonzález-Cordero, G.; González, M. B.; Campabadal, Francesca; Jiménez-Molinos, F.; Roldán, J.B.artículo
closedAccessaccesoRestringido.pdf.jpg8-Feb-2017Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structuresGarcía, Héctor; Castán, H.; Dueñas, S.; González, M. B.; Acero Leal, María Cruz ; Campabadal, Francescacomunicación de congreso
openAccessme_mpedro.pdf.jpg2019An unsupervised and probabilistic approach to Pavlov's dog experiment with OxRAM devicesPedro, M.; Martín-Martínez, Javier; Rodriguez, R.; González, M. B.; Campabadal, Francesca; Nafría, Montserratartículo
openAccesssse-gonzalez-cordero.pdf.jpg2019Analysis of resistive switching processes in TiN/Ti/HfO ⁠2/W devices to mimic electronic synapses in neuromorphic circuitsGonzález-Cordero, G.; Pedro, M.; Martín-Martínez, Javier; González, M. B.; Jiménez-Molinos, F.; Campabadal, Francesca; Nafría, N.; Roldán, J.B.artículo
closedAccessaccesoRestringido.pdf.jpg9-Jun-2014Analysis of the temperature dependence of the switching variability in Ni/HfO2-based RRAM devicesGonzález, M. B.; Rafí, J.M. CSIC ORCID; Beldarrain, O.; Zabala, Miguel; Acero Leal, María Cruz ; Campabadal, Francescacomunicación de congreso
openAccessAssessment of resistive switching characteristics on different.pdf.jpg11-Jun-2018Assessment of resistive switching characteristics on different HfO2/Al2O3 dielectric stacksMaestro, Marcos; Poblador, Samuel CSIC ORCID ; Zabala, Miguel; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francescapóster de congreso
openAccessBlistering of ALD.pdf.jpg28-Sep-2015Blistering of ALD Al2O3 films in Al-Al2O3-Si structuresCampabadal, Francesca; Acero Leal, María Cruz ; Beldarrain, O.; Duch, M.; Zabala, Miguel; González, M. B.póster de congreso
openAccessDedicated Random Telegraph Noise Characterization.pdf.jpg29-Jun-2015Dedicated Random Telegraph Noise Characterization of Ni/HfO2-based RRAM DevicesGonzález, M. B.; Martín-Martínez, Javier; Rodríguez, Rosana; Acero Leal, María Cruz ; Nafría, Montserrat; Campabadal, Francesca; Aymerich, Xaviercomunicación de congreso
openAccess20-Jun-2018Effect of Resistive Switching Cycling on the Physical Characteristics of Ni/HfO2/n+-Si RRAM DevicesMuñoz-Gorriz, J.; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francesca; Miranda, E.póster de congreso
Effect of the blistering of ALD Al2O3 films on the silicon.pdf.jpg11-Feb-2015Effect of the blistering of ALD Al2O3 films on the silicon surface in Al-Al2O3-Si structuresAcero Leal, María Cruz ; Beldarrain, O.; Duch, M.; Zabala, Miguel; González, M. B.; Campabadal, Francescapóster de congreso
openAccessElectrical characterization and resistive switching behavior.pdf.jpg14-Nov-2018Electrical characterization and resistive switching behavior of HfO2/Al2O3 multilayer stacksMaestro, Marcos; Poblador, Samuel CSIC ORCID ; Zabala, Miguel; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francescapóster de congreso
openAccess1.4768167.pdf.jpg2013Electrical characterization of atomic-layer-deposited hafnium oxide films from hafnium tetrakis(dimethylamide) and water/ozone: Effects of growth temperature, oxygen source, and postdeposition annealingGarcía, H.; Castán, H.; Dueñas, S.; Bailón, L.; Campabadal, Francesca; Beldarrain, O.; Zabala, Miguel; González, M. B.; Rafí, J.M. CSIC ORCID artículo
openAccessOct-2017Electrical characterization of defects created by ¿-radiation in HfO2-based MIS structuresGarcía, Héctor; Castán, H.; Dueñas, S.; González, M. B.; Campabadal, Francesca; Acero Leal, María Cruz ; Sambuco Salomone, L.; Faigón, A.póster de congreso
closedAccessaccesoRestringido.pdf.jpgSep-2018Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM ApplicationsGarcía, Héctor; González, M. B.; Mallol, M. M.; Castán, H.; Dueñas, S.; Campabadal, Francesca; Acero Leal, María Cruz ; Sambuco Salomone, L.; Faigón, A.artículo
openAccessElectrical characterization of TiN.pdf.jpg7-Nov-2017Electrical characterization of TiN/Ti/HfO2/W resistive switching devicesPoblador, Samuel CSIC ORCID ; Acero Leal, María Cruz ; Mallol, M. M.; González, M. B.; Campabadal, Francescacomunicación de congreso
openAccessExploring the Multilevel Capabiblity of TIN.pdf.jpg27-Jun-2016Exploring the Multilevel Capabiblity of TIN/Ti/HfO2/W RRAM Devices by Pulse ProgrammingGonzález, M. B.; Acero Leal, María Cruz ; Calvo Angos, José; Zabala, Miguel; Campabadal, Francescacomunicación de congreso
openAccessManuscript_#SSE-D-13-00195_revised_vfinal.pdf.jpg2013Impact of electrical stress on the electrical characteristics of 2 MeV electron irradiated metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O<inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectricsRafí, J.M. CSIC ORCID ; González, M. B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Beldarrain, O.; Zabala, Miguel; Campabadal, Francescaartículo