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| Rights | Preview | Issue Date | Title | Author(s) | Type |
| openAccess |  | 2013 | 2 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O <inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectrics | Rafí, J.M. CSIC ORCID ; Campabadal, Francesca; Ohyama, H.; Takakura, K.; Tsunoda, I.; Zabala, Miguel; Beldarrain, O.; González, M. B.; García, H.; Castán, H.; Gómez, A.; Dueñas, S. | artículo |
| openAccess |  | 2013 | 2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al<inf>2</inf>O<inf>3</inf> dielectrics of different thickness | Rafí, J.M. CSIC ORCID ; González, M. B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Beldarrain, O.; Zabala, Miguel; Campabadal, Francesca | artículo |
| openAccess |  | 2019 | A flexible characterization methodology of RRAM: Application to the modeling of the conductivity changes as synaptic weight updates | Pedro, M.; Martín-Martínez, Javier; Rodriguez, R.; González, M. B.; Campabadal, Francesca; Nafría, Montserrat | artículo |
| openAccess |  | 2019 | A new technique to analyze RTN signals in resistive memories | González-Cordero, G.; González, M. B.; Campabadal, Francesca; Jiménez-Molinos, F.; Roldán, J.B. | artículo |
| closedAccess |  | 8-Feb-2017 | Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structures | García, Héctor; Castán, H.; Dueñas, S.; González, M. B.; Acero Leal, María Cruz ; Campabadal, Francesca | comunicación de congreso |
| openAccess |  | 2019 | An unsupervised and probabilistic approach to Pavlov's dog experiment with OxRAM devices | Pedro, M.; Martín-Martínez, Javier; Rodriguez, R.; González, M. B.; Campabadal, Francesca; Nafría, Montserrat | artículo |
| openAccess |  | 2019 | Analysis of resistive switching processes in TiN/Ti/HfO 2/W devices to mimic electronic synapses in neuromorphic circuits | González-Cordero, G.; Pedro, M.; Martín-Martínez, Javier; González, M. B.; Jiménez-Molinos, F.; Campabadal, Francesca; Nafría, N.; Roldán, J.B. | artículo |
| closedAccess |  | 9-Jun-2014 | Analysis of the temperature dependence of the switching variability in Ni/HfO2-based RRAM devices | González, M. B.; Rafí, J.M. CSIC ORCID; Beldarrain, O.; Zabala, Miguel; Acero Leal, María Cruz ; Campabadal, Francesca | comunicación de congreso |
| openAccess |  | 11-Jun-2018 | Assessment of resistive switching characteristics on different HfO2/Al2O3 dielectric stacks | Maestro, Marcos; Poblador, Samuel CSIC ORCID ; Zabala, Miguel; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francesca | póster de congreso |
| openAccess |  | 28-Sep-2015 | Blistering of ALD Al2O3 films in Al-Al2O3-Si structures | Campabadal, Francesca; Acero Leal, María Cruz ; Beldarrain, O.; Duch, M.; Zabala, Miguel; González, M. B. | póster de congreso |
| openAccess |  | 29-Jun-2015 | Dedicated Random Telegraph Noise Characterization of Ni/HfO2-based RRAM Devices | González, M. B.; Martín-Martínez, Javier; Rodríguez, Rosana; Acero Leal, María Cruz ; Nafría, Montserrat; Campabadal, Francesca; Aymerich, Xavier | comunicación de congreso |
| openAccess | | 20-Jun-2018 | Effect of Resistive Switching Cycling on the Physical Characteristics of Ni/HfO2/n+-Si RRAM Devices | Muñoz-Gorriz, J.; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francesca; Miranda, E. | póster de congreso |
|  | 11-Feb-2015 | Effect of the blistering of ALD Al2O3 films on the silicon surface in Al-Al2O3-Si structures | Acero Leal, María Cruz ; Beldarrain, O.; Duch, M.; Zabala, Miguel; González, M. B.; Campabadal, Francesca | póster de congreso |
| openAccess |  | 14-Nov-2018 | Electrical characterization and resistive switching behavior of HfO2/Al2O3 multilayer stacks | Maestro, Marcos; Poblador, Samuel CSIC ORCID ; Zabala, Miguel; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francesca | póster de congreso |
| openAccess |  | 2013 | Electrical characterization of atomic-layer-deposited hafnium oxide films from hafnium tetrakis(dimethylamide) and water/ozone: Effects of growth temperature, oxygen source, and postdeposition annealing | García, H.; Castán, H.; Dueñas, S.; Bailón, L.; Campabadal, Francesca; Beldarrain, O.; Zabala, Miguel; González, M. B.; Rafí, J.M. CSIC ORCID | artículo |
| openAccess | | Oct-2017 | Electrical characterization of defects created by ¿-radiation in HfO2-based MIS structures | García, Héctor; Castán, H.; Dueñas, S.; González, M. B.; Campabadal, Francesca; Acero Leal, María Cruz ; Sambuco Salomone, L.; Faigón, A. | póster de congreso |
| closedAccess |  | Sep-2018 | Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications | García, Héctor; González, M. B.; Mallol, M. M.; Castán, H.; Dueñas, S.; Campabadal, Francesca; Acero Leal, María Cruz ; Sambuco Salomone, L.; Faigón, A. | artículo |
| openAccess |  | 7-Nov-2017 | Electrical characterization of TiN/Ti/HfO2/W resistive switching devices | Poblador, Samuel CSIC ORCID ; Acero Leal, María Cruz ; Mallol, M. M.; González, M. B.; Campabadal, Francesca | comunicación de congreso |
| openAccess |  | 27-Jun-2016 | Exploring the Multilevel Capabiblity of TIN/Ti/HfO2/W RRAM Devices by Pulse Programming | González, M. B.; Acero Leal, María Cruz ; Calvo Angos, José; Zabala, Miguel; Campabadal, Francesca | comunicación de congreso |
| openAccess |  | 2013 | Impact of electrical stress on the electrical characteristics of 2 MeV electron irradiated metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O<inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectrics | Rafí, J.M. CSIC ORCID ; González, M. B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Beldarrain, O.; Zabala, Miguel; Campabadal, Francesca | artículo |
