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Browsing by Author Frisenda, Riccardo

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Showing results 1 to 11 of 11
RightsPreviewIssue DateTitleAuthor(s)Type
closedAccessaccesoRestringido.pdf.jpg16-Oct-2017Characterization of highly crystalline lead iodide nanosheets prepared by room-temperature solution processingFrisenda, Riccardo; Island, Joshua O.; Lado, Jose L.; Giovanelli, Emerson; Gant, Patricia; Nagler, Philipp; Bange, Sebastian; Lupton, John M.; Schüller, Christian; Molina-Mendoza, Aday J.; Aballe, Lucia; Foerster, Michael; Korn, Tobias; Angel Niño, Miguel; Pérez de Lara, David; Pérez, Emilio M.; Fernandéz-Rossier, Joaquín; Castellanos-Gómez, Andrés  artículo
closedAccessaccesoRestringido.pdf.jpg2017Gate tunable photovoltaic effect in MoS2 vertical p–n homostructuresSvatek, Simon A.; Antolín, Elisa; Lin, Der-Yuh; Frisenda, Riccardo; Reuter, Christoph; Molina-Mendoza, Aday J.; Muñoz Sánchez, Manuel ; Ko, Tsung-Shine; Pérez de Lara, David; Castellanos-Gómez, Andrés  artículo
openAccesselectronics-06-00028-v2.pdf.jpg31-Mar-2017High Throughput Characterization of Epitaxially Grown Single-Layer MoS2Ghasemi, Foad; Frisenda, Riccardo; Dumcenco, Dumitru; Kis, Andras; Pérez de Lara, David; Castellanos-Gómez, Andrés  artículo
openAccessFRISENDA-NanoLett-2015-postprint.pdf.jpg21-Apr-2015Kondo effect in a neutral and stable all organic radical single molecule break junctionFrisenda, Riccardo; Gaudenzi, Rocco; Franco, Carlos ; Mas Torrent, Marta ; Rovira, Concepció ; Veciana, Jaume ; Alcon, Isaac; Bromley, Stefan T.; Burzurí, Enrique; Van der Zant, Herre S.J.artículo
closedAccessaccesoRestringido.pdf.jpg21-Nov-2017Lithography-free electrical transport measurements on 2D materials by direct microprobingGant, Patricia; Niu, Yue; Svatek, Simon A.; Agraït, Nicolás; Munuera, C. ; García-Hernández, M.  ; Frisenda, Riccardo; Pérez de Lara, David; Castellanos-Gómez, Andrés  artículo
openAccessoptical_contrast_refractive_index_natural_van_der_Waals.pdf.jpg8-Nov-2017Optical contrast and refractive index of natural van der Waals heterostructure nanosheets of franckeiteGant, Patricia; Ghasemi, Foad; Maeso, David; Munuera, C. ; López-Elvira, E.; Frisenda, Riccardo; Lara, David Pérez de; Rubio-Bollinger, Gabino; García-Hernández, M.  ; Castellanos-Gómez, Andrés  artículo
closedAccessaccesoRestringido.pdf.jpg21-Jul-2017Photodiodes based in La0.7Sr0.3MnO3/single layer MoS2 hybrid vertical heterostructuresNiu, Yue; Frisenda, Riccardo; Svatek, Simon A.; Orfila, Gloria; Gallego-Marcos, Fernando ; Gant, Patricia; Agra, Nicolás; León, Carlos ; Rivera-Calzada, Alberto; Pérez de Lara, David; Santamaría, Jacobo ; Castellanos-Gómez, Andrés  artículo
openAccessYueNiu_Polarization_TiS3_photodetector_vArXiv.pdf.jpg4-Oct-2018Polarization‐Sensitive and Broadband Photodetection Based on a Mixed‐Dimensionality TiS3/Si p–n JunctionNiu, Yue; Frisenda, Riccardo; Flores, Fernando; Ares, José R.; Jiao, Weicheng; Pérez de Lara, David; Sánchez López, Carlos; Wang, Rongguo; Ferrer, Isabel J.; Castellanos-Gómez, Andrés  artículo
openAccessprogress on black phosphorus optics_arXiv_version.pdf.jpg4-Oct-2018Progress on Black Phosphorus PhotonicsDeng, Bingchen; Frisenda, Riccardo; Li, Cheng; Chen, Xiaolong; Castellanos-Gómez, Andrés  ; Xia, Fengnianartículo
embargoedAccessAuthorsVersion_BucklingMetrology_postreferee.pdf.jpg7-Jan-2019Revisiting the Buckling Metrology Method to Determine the Young's Modulus of 2D MaterialsIguiniz, Nestor; Frisenda, Riccardo; Bratschitsch, Rudolf; Castellanos-Gómez, Andrés  artículo
nanomaterials-08-00725.pdf.jpg14-Sep-2018Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2Niu, Yue; González Abad, Sergio; Frisenda, Riccardo; Marauhn, Philipp; Drüppel, Matthias; Gant, Patricia; Schmidt, Robert; Taghavi, Najme S.; Barcons, David; Molina-Mendoza, Aday J.; Vasconcellos, Steffen Michaelis de; Bratschitsch, Rudolf; Pérez de Lara, David; Rohlfing, Michael; Castellanos-Gómez, Andrés  artículo