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Browsing by Author Campabadal, Francesca

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openAccessManuscript_#SSE-D-11-00531_revised_version_with_all_changes_accepted_vfinal.pdf.jpg20132 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O <inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectricsRafí, J.M. CSIC ORCID ; Campabadal, Francesca; Ohyama, H.; Takakura, K.; Tsunoda, I.; Zabala, Miguel; Beldarrain, O.; González, M. B.; García, H.; Castán, H.; Gómez, A.; Dueñas, S.artículo
openAccessMR-D-13-00242R1-2_pagines_rellevants.pdf.jpg20132 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al<inf>2</inf>O<inf>3</inf> dielectrics of different thicknessRafí, J.M. CSIC ORCID ; González, M. B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Beldarrain, O.; Zabala, Miguel; Campabadal, Francescaartículo
openAccesssse_mpedro.pdf.jpg2019A flexible characterization methodology of RRAM: Application to the modeling of the conductivity changes as synaptic weight updatesPedro, M.; Martín-Martínez, Javier; Rodriguez, R.; González, M. B.; Campabadal, Francesca; Nafría, Montserratartículo
openAccessme_gonzalez-cordero.pdf.jpg2019A new technique to analyze RTN signals in resistive memoriesGonzález-Cordero, G.; González, M. B.; Campabadal, Francesca; Jiménez-Molinos, F.; Roldán, J.B.artículo
closedAccessaccesoRestringido.pdf.jpg8-Feb-2017Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structuresGarcía, Héctor; Castán, H.; Dueñas, S.; González, M. B.; Acero Leal, María Cruz ; Campabadal, Francescacomunicación de congreso
openAccessme_mpedro.pdf.jpg2019An unsupervised and probabilistic approach to Pavlov's dog experiment with OxRAM devicesPedro, M.; Martín-Martínez, Javier; Rodriguez, R.; González, M. B.; Campabadal, Francesca; Nafría, Montserratartículo
openAccesssse-gonzalez-cordero.pdf.jpg2019Analysis of resistive switching processes in TiN/Ti/HfO ⁠2/W devices to mimic electronic synapses in neuromorphic circuitsGonzález-Cordero, G.; Pedro, M.; Martín-Martínez, Javier; González, M. B.; Jiménez-Molinos, F.; Campabadal, Francesca; Nafría, N.; Roldán, J.B.artículo
closedAccessaccesoRestringido.pdf.jpg9-Jun-2014Analysis of the temperature dependence of the switching variability in Ni/HfO2-based RRAM devicesGonzález, M. B.; Rafí, J.M. CSIC ORCID; Beldarrain, O.; Zabala, Miguel; Acero Leal, María Cruz ; Campabadal, Francescacomunicación de congreso
openAccessTDMR_JordiMuñoz.pdf.jpg2019Assessing the correlation between location and size of catastrophic breakdown events in high-k mim capacitorsMuñoz-Gorriz, J.; Blachier, D.; Reimbold, G.; Campabadal, Francesca; Sune, J.; Monaghan, S.; Cherkaoui, K.; Hurley, P.K.; Miranda, E.artículo
openAccessAssessment of resistive switching characteristics on different.pdf.jpg11-Jun-2018Assessment of resistive switching characteristics on different HfO2/Al2O3 dielectric stacksMaestro, Marcos; Poblador, Samuel CSIC ORCID ; Zabala, Miguel; Acero Leal, María Cruz ; González, M. B.; Campabadal, Francescapóster de congreso
closedAccess28-Feb-2007The ATLAS semiconductor tracker end-cap moduleFleta, Celeste CSIC ORCID; Martí García, Salvador CSIC ORCID; Lacasta Llácer, Carlos CSIC ORCID ; Fuster, Juan CSIC ORCID; Rafí, J.M. CSIC ORCID ; García García, Carmen CSIC ORCID; Stugu, Bjarne; Mellado, Bruce; Bernabeu Verdú, José CSIC ORCID; García Navarro, José Enrique CSIC ORCID; Ullán Comes, Miguel ; González González, Francisco; González Sevilla, Sergio CSIC; Modesto, Pablo; Campabadal, Francesca; Llosá, Gabriela CSIC ORCID; Lozano Fantoba, Manuel CSIC ORCID ; Costa, María José CSIC ORCID; Escobar, Carlos CSIC ORCID ; Pellegrini, Giulio; Rodríguez Oliete, Rosario; Sánchez Martínez, Javier CSIC ORCID; Strachko, V.; Civera, José Vicente CSIC; Miñano, Mercedes CSIC ORCID; Oye, O. K.; Sospedra, Luis CSICartículo
openAccessBlistering of ALD.pdf.jpg28-Sep-2015Blistering of ALD Al2O3 films in Al-Al2O3-Si structuresCampabadal, Francesca; Acero Leal, María Cruz ; Beldarrain, O.; Duch, M.; Zabala, Miguel; González, M. B.póster de congreso
closedAccessaccesoRestringido.pdf.jpg15-Jun-1992Carrier transport and storage in Si3N4 for metal-nitride-oxide-semiconductor memory applicationsMartín, Ferran; Aymerich, Xavier; Campabadal, Francesca; Acero Leal, María Cruz artículo
closedAccess24-May-2007Characterisation of p-type detectors for the future Super-LHCLacasta Llácer, Carlos CSIC ORCID ; Campabadal, Francesca; Fleta, Celeste CSIC ORCID; García García, Carmen CSIC ORCID; Lozano Fantoba, Manuel CSIC ORCID ; Martí García, Salvador CSIC ORCID; Miñano, Mercedes CSIC ORCID; Pellegrini, Giulio; Rafí, J.M. CSIC ORCID ; Ullán Comes, Miguel artículo
closedAccess4-Feb-2007Characterization of edgeless detectors fabricated by dry etching processPellegrini, Giulio; Campabadal, Francesca; Lozano Fantoba, Manuel CSIC ORCID ; Martí García, Salvador CSIC ORCID; Miñano, Mercedes CSIC ORCID; Rafí, J.M. CSIC ORCID ; Ullán Comes, Miguel artículo
closedAccess30-Aug-2007Characterization of irradiated detectors fabricated on p-type silicon substrates for super-LHCMiñano, Mercedes CSIC ORCID; Campabadal, Francesca; Escobar, Carlos CSIC ORCID ; García García, Carmen CSIC ORCID; González Sevilla, Sergio CSIC; Lacasta Llácer, Carlos CSIC ORCID ; Lozano Fantoba, Manuel CSIC ORCID ; Martí García, Salvador CSIC ORCID; Pellegrini, Giulio; Rafí, J.M. CSIC ORCID ; Ullán Comes, Miguel artículo
Comparison between Al2O3 thin films grown by ALD.pdf.jpg8-Feb-2011Comparison between Al2O3 thin films grown by ALD using H2O or O3 as oxidant sourceCampabadal, Francesca; Beldarrain, O.; Zabala, Miguel; Acero Leal, María Cruz ; Rafí, J.M. CSIC ORCIDcomunicación de congreso
openAccessDedicated Random Telegraph Noise Characterization.pdf.jpg29-Jun-2015Dedicated Random Telegraph Noise Characterization of Ni/HfO2-based RRAM DevicesGonzález, M. B.; Martín-Martínez, Javier; Rodríguez, Rosana; Acero Leal, María Cruz ; Nafría, Montserrat; Campabadal, Francesca; Aymerich, Xaviercomunicación de congreso
openAccessPSD_2008_NIMA_manuscript_JMRafi_et_al_vfinal_revised.pdf.jpg1-Jun-2009Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiationRafí, J.M. CSIC ORCID ; Boulord, C.; Hayama, K.; Ohyama, H.; Campabadal, Francesca; Pellegrini, G.; Lozano, M.; Simoen, E.; Claeys, C.artículo
openAccessManuscript_#JES-10-0845R1_3rd_revision_vfinal.pdf.jpg2011Deposition temperature and thermal annealing effects on the electrical characteristics of atomic layer deposited Al<inf>2</inf>O<inf>3</inf> films on siliconRafí, J.M. CSIC ORCID ; Zabala, Miguel; Beldarrain, O.; Campabadal, Francescaartículo