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Browsing by Author Barragán, Manuel J.

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RightsPreviewIssue DateTitleAuthor(s)Type
openAccessbist.pdf.jpg2010A BIST solution for frequency domain characterization of analog circuitsBarragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCIDartículo
openAccessA BIST Solution.pdf.jpg2009A BIST solution for the functional characterization of RF systems based on envelope response analysisBarragán, Manuel J. CSIC ORCID; Fiorelli, R. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L.comunicación de congreso
openAccessFeatureDesign_postprint.pdf.jpg2015A Procedure for Alternate Test Feature Design and SelectionBarragán, Manuel J. CSIC ORCID; Leger, Gildas CSIC ORCID artículo
openAccessTest of LNAs.pdf.jpg6-Jan-2011Alternate test of LNAs through ensemble learning of on-chip digital envelope signaturesBarragán, Manuel J. CSIC ORCID; Fiorelli, R. CSIC ORCID; Leger, Gildas CSIC ORCID ; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L.artículo
openAccessanalog.pdf.jpg8-Jan-2011Analog sinewave signal generators for mixed-signal built-in test applicationsBarragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCIDartículo
openAccessbellatrix.jpg.jpg2010bellatrixBarragán, Manuel J. CSIC ORCID; Peralías, E. CSIC ORCID circuito integrado
openAccess2007-DATE07.pdf.jpgMay-2007BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated CircuitsZjajo, Amir; Barragán, Manuel J. CSIC ORCID; Pineda de Gyvez, Josécomunicación de congreso
closedAccess; openAccessbrownian_distance_correlation-directed_search_fast_feature_selection_technique_alternate_test.pdf.jpgSep-2016Brownian distance correlation-directed search: A fast feature selection technique for alternate testLeger, Gildas CSIC ORCID ; Barragán, Manuel J. CSIC ORCIDartículo
openAccessreadme.pdf.jpg2019Defect filter construction [Dataset]Leger, Gildas CSIC ORCID ; Ginés, Antonio; Gutiérrez, Valentín; Barragán, Manuel J. CSIC ORCIDdataset
closedAccessaccesoRestringido.pdf.jpg2012Digital adaptive calibration of multi-step analog to digital convertersZjajo, Amir; Barragán, Manuel J. CSIC ORCID; Pineda de Gyvez, Joséartículo
openAccessEfficient Functional.pdf.jpg2009Efficient functional built-in test for RF systems using two-tone response envelope analysisBarragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L.comunicación de congreso
closedAccessaccesoRestringido.pdf.jpg2013Efficient selection of signatures for analog/RF alternate testBarragán, Manuel J. CSIC ORCID; Leger, Gildas CSIC ORCID comunicación de congreso
openAccessEVALUACIÓN ON-CHIP.pdf.jpgMay-2009Generación y evaluación on-chip de señales analógicas para aplicaciones bist de circuitos analógicos y de señal mixtaBarragán, Manuel J. CSIC ORCIDtesis doctoral
openAccessGuidelines for the efficient.pdf.jpg2010Guidelines for the efficient design of sinewave generators for analog/mixed-signal BISTBarragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L.comunicación de congreso
openAccessidus.jpg.jpg2010idusBarragán, Manuel J. CSIC ORCID; Peralías, E. CSIC ORCID circuito integrado
openAccessRF alternate.pdf.jpgNov-2011Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAsBarragán, Manuel J. CSIC ORCID; Fiorelli, R. CSIC ORCID; Leger, Gildas CSIC ORCID ; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L.comunicación de congreso
openAccessLow-cost signature.pdf.jpgMay-2010Low-cost signature test of RF blocks based on envelope response analysisBarragán, Manuel J. CSIC ORCID; Fiorelli, R. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L.comunicación de congreso
closedAccess6-Feb-2012Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOSZjajo, Amir; Barragán, Manuel J. CSIC ORCID; Pineda de Gyvez, Joséartículo
openAccessmenkar.jpg.jpg2009menkarBarragán, Manuel J. CSIC ORCID; Peralías, E. CSIC ORCID circuito integrado
openAccessWO2013001131A1.pdf.jpg3-Jan-2013Method and system for testing integrated radio-frecuency circuits at the wafer level and the use thereofHuertas-Díaz, J. L.; Barragán, Manuel J. CSIC ORCIDpatente