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Navegación por Autor Amann, A.
Mostrando resultados 1 a 3 de 3
Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
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openAccess | 2014 | Defect analysis and alignment quantification of line arrays prepared by directed self-assembly of a block copolymer | Simao, Claudia CSIC ORCID; Tuchapsky, D.; Amann, A.; Morris, Michael A.; Sotomayor Torres, C. M. CSIC ORCID | comunicación de congreso | |
closedAccess | 2015 | Dimensional and defectivity nanometrology of directed self-assembly patterns | Simao, Claudia CSIC ORCID; Tuchapsky, D.; Khunsin, W. CSIC; Amann, A.; Morris, Michael A.; Sotomayor Torres, C. M. CSIC ORCID | artículo | |
openAccess | 2014 | Order and defectivity nanometrology by image processing and analysis of sub-20 nm BCPs features for lithographic applications | Simao, Claudia CSIC ORCID; Tuchapsky, D.; Khunsin, W. CSIC; Amann, A.; Morris, Michael A.; Sotomayor Torres, C. M. CSIC ORCID | comunicación de congreso |