Mostrando resultados 22 a 31 de 31
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| Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
| closedAccess |  | dic-2008 | Power-Substrate Static Thermal Characterization Based on a Test Chip | Jordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; Coleto, J. | artículo |
| openAccess |  | 8-ago-2016 | Procedimiento de análisis funcional de semiconductores alimentados inalámbricamente | León Cerro, Javier; Perpiñà, X.; Vellvehi Hernández, Miquel; Jordà, Xavier | patente |
| openAccess |  | 8-ago-2016 | Procedimiento de análisis funcional de semiconductores alimentados inalámbricamente | León Cerro, Javier; Perpiñà, X.; Vellvehi Hernández, Miquel; Jordà, Xavier | solicitud de patente |
| openAccess | ![ARTICULOS13782[1].pdf.jpg](/retrieve/1082486/ARTICULOS13782%5b1%5d.pdf.jpg) | 12-dic-2009 | Reduced-Order Thermal Behavioral Model Based on Diffusive Representation | Allard, Bruno; Jordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; M’Rad, Sabrine | artículo |
| openAccess |  | 30-jul-2009 | Self-aligned metal mask assembly for selectively depositing thin films on microelectronic substrates and devices, and method of use | Jordà, Xavier; Perpiñá Giribet, Xavier; Vellvehi Hernández, Miquel; Sánchez Sánchez, David; Godignon, Philippe | patente |
| closedAccess | | oct-2004 | Self-heating experimental study of 600 V PT-IGBTs under low dissipation energies | Perpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, José | artículo |
| closedAccess | | jul-2011 | SiC Schottky Diodes for Harsh Environment Space Applications | Godignon, Philippe; Jordà, Xavier; Vellvehi Hernández, Miquel; Perpiñà, X.; Banu, Viorel; López, Demetrio; Barbero, Juan; Brosselard, P.; Massetti, Silvia | artículo |
| closedAccess | | ago-2008 | Steady-state sinusoidal thermal characterization at chip level by internal infrared-laser deflection | Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Altet, J.; Mestres, Narcís CSIC ORCID | artículo |
| openAccess |  | sep-2005 | Thermal calibration procedure for internal infrared laser deflection apparatus | Perpiñà, X.; Jordà, Xavier; Madrid, Francesc CSIC; Flores, David; Hidalgo, Salvador ; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID | artículo |
| closedAccess | | dic-2006 | Transmission Fabry–Pérot interference thermometry for thermal characterization of microelectronic devices | Perpiñà, X.; Jordà, Xavier; Madrid, Francesc CSIC; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID | artículo |
