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Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
openAccess | | 10-jun-2019 | A compact model to evaluate the effects of high level c++ code hardening in radiation environments | Reyneri, L. M.; Serrano-Cases, A.; Morilla, Yolanda CSIC ORCID; Cuenca-Asensi, Sergio; Martínez-Álvarez, A. | artículo |
openAccess | | 3-nov-2006 | A view of the implanted SiC damage by Rutherford backscattering spectroscopy, spectroscopic ellipsometry, and transmission electron microscopy | Battistig, Gabor; García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
closedAccess | | 13-mar-2008 | Accelerator-based research activities at "Centro Nacional de Aceleradores", Seville (Spain) | Respaldiza, M. A. CSIC ORCID; Ager, F. J. CSIC ORCID; Carmona, Asunción; Ferrer, F. J. CSIC ORCID; García-León, Manuel CSIC ORCID; García López, J. CSIC ORCID; García-Orellana, Isabel; Gómez-Tubío, B. CSIC ORCID; Morilla, Yolanda CSIC ORCID; Ontalba-Salamanca, M. Á.; Ortega-Feliú, I. CSIC | artículo |
openAccess | | 2009 | All chemical YBa2Cu3O7 superconducting multilayers: Critical role of CeO2 cap layer flatness | Coll, Mariona CSIC ORCID; Gázquez, Jaume CSIC ORCID; Hühne, Ruben; Holzapfel, B.; Morilla, Yolanda CSIC ORCID; García López, J. CSIC ORCID; Pomar, Alberto CSIC ORCID; Sandiumenge, Felip CSIC ORCID; Puig Molina, Teresa CSIC ORCID ; Obradors, Xavier CSIC ORCID | artículo |
closedAccess | | ago-2023 | Analysis of Kernel Redundancy for Soft Error Mitigation on Embedded GPUs | Serrano-Cases, A.; Alcaide, S.; Romero, M. A.; Morilla, Yolanda CSIC ORCID; Cuenca-Asensi, Sergio | artículo |
openAccess | | 30-mar-2017 | CNA facility for testing electronics | Morilla, Yolanda CSIC ORCID | comunicación de congreso |
closedAccess | | 17-mar-2008 | Complex dielectric function of ion implantation amorphized SiC determined by spectroscopic ellipsometry | Lohner, T.; García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
closedAccess | | 2009 | Determination of nitrogen partitioning coefficients in superduplex stainless steels by NRA using a nuclear microprobe | Muñoz, Concepción; Morilla, Yolanda CSIC ORCID; García López, J. CSIC ORCID; Paúl, A.; Odriozola, José Antonio CSIC ORCID | artículo |
closedAccess | | 2012 | Developing the IBA equipment to increase the versatility of the CNA | Morilla, Yolanda CSIC ORCID; Jiménez-Ramos, M. C. CSIC ORCID; García López, J. CSIC ORCID; Labrador, J. A. CSIC; Palomo, Francisco Rogelio; Ortega-Feliú, I. CSIC | artículo |
closedAccess | | 2009 | Dynamic annealing study of SiC epilayers implanted with Ni ions at different temperatures | García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID; Battistig, Gabor | artículo |
closedAccess | | 2011 | Early works on the nuclear microprobe for microelectronics irradiation tests at the CEICI (Sevilla, Spain) | Palomo, Francisco Rogelio; Morilla, Yolanda CSIC ORCID; Mogollón, J. M.; García López, J. CSIC ORCID; Labrador, J. A. CSIC; Aguirre, M. A. | artículo |
openAccess | | oct-2023 | Effect of ionizing radiation on quasi-floating gate transistors | Luján-Martínez, Clara; Hinojo-Montero, José; Muñoz, Fernando; Palomo, Francisco Rogelio; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
openAccess | | 2020 | Empirical mathematical model of microprocessor sensitivity and early prediction to proton and neutron radiation-induced soft errors | Serrano-Cases, A.; Reyneri, L. M.; Morilla, Yolanda CSIC ORCID; Cuenca-Asensi, Sergio; Martínez-Álvarez, A. | artículo |
openAccess | | 16-sep-2018 | Error detection through trace infrastructure in ARM microprocessors | Peña-Fernandez, M.; Lindoso, Almudena; Entrena, Luis A.; García-Valderas, Mario; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID | póster de congreso |
closedAccess | | ago-2023 | Evaluating Reduced Resolution Redundancy for Radiation Hardening in FPGA Designs | García-Astudillo, Luis A.; Lindoso, Almudena; Entrena, Luis A.; Martín, Honorio; García-Valderas, Mario; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
openAccess | | 2020 | Evaluation of a COTS 65-nm SRAM under 15 MeV protons and 14 MeV neutrons at low VDD | Rezaei, Mohammadreza; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID; Franco, Francisco J.; Fabero, Juan Carlos; Mecha, Hortensia; Puchner, Helmut; Hubert, Guillaume; Clemente, Juan Antonio | artículo |
closedAccess | | 5-abr-2018 | Evaluation of the suitability of NEON SIMD microprocessor extensions under proton irradiation | Lindoso, Almudena; García-Valderas, Mario; Entrena, Luis A.; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID | artículo |
closedAccess | | 2-oct-2017 | Evaluation of the suitability of SIMD microprocessor extensions in radiation environments | Lindoso, Almudena; García-Valderas, Mario; Entrena, Luis A.; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID | póster de congreso |
openAccess | | 2-oct-2017 | Farmer chamber response to different filter box and surrounding configurations | Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID; Domínguez, Manuel; Fernandez, G. | póster de congreso |
closedAccess | | 2003 | High energy ion characterization of sputtered AlN thin films | García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID; Respaldiza, M. A. CSIC ORCID | artículo |