Mostrando resultados 10 a 20 de 20
< Anterior
Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
openAccess | | 19-abr-2021 | Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblock | Nafria, M.; Diaz-Fortuny, J.; Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Martín-Lloret, P. CSIC; Toro-Frias, A. CSIC; Mateo, D.; Barajas, E.; Aragones, X.; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
openAccess | | 29-jun-2015 | Dedicated Random Telegraph Noise Characterization of Ni/HfO2-based RRAM Devices | González, M. B.; Martín-Martínez, Javier; Rodríguez, Rosana; Acero Leal, María Cruz CSIC ORCID ; Nafría, Montserrat; Campabadal, Francesca CSIC ORCID ; Aymerich, Xavier | comunicación de congreso |
openAccess | | 1-oct-2022 | Determination of the time vonstant distribution of a defect-ventric time-dependent variability model for sub-100-nm FETs | Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
openAccess | | 2020 | Flexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated Circuits | Díaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
closedAccess | | ago-2016 | Investigation of Filamentary Current Fluctuations Features in the High-Resistance State of Ni/HfO2-Based RRAM | González, M. B.; Martín-Martínez, Javier; Maestro, Marcos; Acero Leal, María Cruz CSIC ORCID ; Nafría, Montserrat; Campabadal, Francesca CSIC ORCID | artículo |
closedAccess | | 8-feb-2017 | Ni/HfO2/Si resistive switching structures: A device level and nanoscale analysis with CAFM | Claramunt, S.; Wu, Q.; Maestro, Marcos; Porti, M.; Acero Leal, María Cruz CSIC ORCID ; González, M. B.; Martín-Martínez, Javier; Campabadal, Francesca CSIC ORCID ; Nafría, Montserrat | póster de congreso |
openAccess | | 27-may-2022 | On the impact of the biasing history on the characterization of random telegraph noise | Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
closedAccess | | sep-2016 | Reliability simulation for analog ICs: Goals, solutions, and challenges | Toro-Frias, A. CSIC; Martín-Lloret, P. CSIC; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
openAccess | | 2021 | Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation | Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
openAccess | | 2021 | Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions | Díaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Rodríguez, Rosana; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
closedAccess | | 21-sep-2003 | Towards a "Quasi-Digital" Magnetic Microvalve | Duch, M.; Pérez Castillejo, Raquel; Yaakoubi, N.; Acero Leal, María Cruz CSIC ORCID ; Esteve i Tintó, Jaume; Gómez, E.; Vallés, E.; Martín-Martínez, Javier | comunicación de congreso |