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DerechosPreviewFecha Public.TítuloAutor(es)Tipo
closedAccessaccesoRestringido.pdf.jpg30-mar-20172D plasmonic diffractive patterns in metals by laser interferencePeláez, Ramón J. CSIC ORCID; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN comunicación de congreso
openAccess21-jun-2021A facility for measuring the BSSRDFSantafé, Pablo CSIC ORCID; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Tejedor-Sierra, Néstor CSIC; Velázquez, J.L. CSIC ORCID CVNcomunicación de congreso
openAccess24-jun-2014A new filter radiometer for the thermodynamic measurement of high temperature fixed pointsMantilla, J.M.; Martín, M. J.; Hernanz, María Luisa CSIC; Pons Aglio, Alicia CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Campo, D. delpóster de congreso
openAccessFerrero.pdf.jpg2013A single analytical model for sparkle and graininess patterns in texture of effect coatingsFerrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Rabal, Ana M. CSIC; Pons Aglio, Alicia CSIC ORCIDartículo
openAccessAccounting for polarization–related.pdf.jpg13-jul-2020Accounting for polarization-related effects in the measurement of the bidirectional reflectance distribution functionCalderón, A.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN artículo
openAccessAccurate physics-based.pdf.jpg3-oct-2021Accurate physics-based digital reproduction of effect coatingsHuraibat, Khalil; Perales, Esther; Kirchner, Eric; Van der Lans, I.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN artículo
openAccessCOMUNICACIONES_A_CONGRESOS293694[1].pdf.jpg2010An absolute radiometer based on InP photodiodesMuñoz Zurita, Ana Luz; Campos Acosta, Joaquín CSIC ORCID CVN ; Gómez Jiménez, Ramón; Uribe Valladares, Rodrigocomunicación de congreso
openAccesspresent capabilities.pdf.jpg5-nov-2020An insight into the present capabilities of national metrology institutes for measuring sparkleFerrero, Alejandro CSIC ORCID; Basic, N.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pastuschek, M.; Perales, E.; Porrovecchio, G.; Šmid, M.; Schirmacher, A.; Velázquez, J.L. CSIC ORCID CVN; Martínez-Verdú, F.M.artículo
openAccessPhysRevD_AndresCarcasona_et_al_2023.pdf.jpg27-oct-2022An instrumented baffle for the Advanced Virgo Input Mode Cleaner End MirrorAndres-Carcasona, M.; Ballester, O.; Blanch, O.; Campos Acosta, Joaquín CSIC ORCID CVN ; Caneva, G.; Cardiel, L.; Cavalli-Sforza, M.; Chiggiato, P.; Chiummo, A.; Ferreira, J. A.; Illa, J. M.; Karathanasis,C.; Kolstein, M.; Martinez, M.; Macquet, A.; Menendez-Vazquez, A.; Mir, Ll. M.; Mundet, J.; Pasqualetti, A.; Piccinni, O.; Pio, C.; Romero-Rodriguez, A.; Serrano, D.; Dattilo, V.artículo
openAccess19-jul-2016Análisis cromático de fuentes OLEDsVelázquez, J.L. CSIC ORCID CVN; Ferrero, Alejandro CSIC ORCID; Pons Aglio, Alicia CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Hernanz, María Luisa CSIC; Borreguero, E. CSIC; Bernard, Bertacomunicación de congreso
openAccessAngular_Ferrero_Art_2021.pdf.jpg21-nov-2020Angular and Spectral Bandwidth Considerations in BRDF Measurements of Interference- and Diffraction-Based CoatingsFerrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN artículo
openAccessAngular and spectral radiant.pdf.jpg2012Angular and spectral radiant intensity distribution of high brightness white LEDsVillamarín, A.; Ferrero, Alejandro CSIC ORCID; Pons Aglio, Alicia CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Rabal, Ana M. CSIC; Hernanz, María Luisa CSIC; Velázquez, J.L. CSIC ORCID CVN; Corróns, Antonio CSICartículo
closedAccessaccesoRestringido.pdf.jpg2003Anomalous non-linear behaviour of InGaAs photodiodes with overfilled illuminationCorredera, Pedro CSIC ORCID; Hernanz, María Luisa CSIC; González-Herráez, Miguel CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN artículo
openAccess2006Apparent violation of the radiant exposure reciprocity law in interline CCDsFerrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCIDartículo
openAccessCOMUNICACIONES_A_CONGRESOS293722[1].pdf.jpg2010Applying the joint Wigner time-frequency distribution to characterization of ultra-short optical dissipative solitary pulses in the actively mode-locked semiconductor laser with an external single-mode fiber cavityShcherbakov, Alexandre S.; Moreno Zarate, Pedro; Campos Acosta, Joaquín CSIC ORCID CVN ; Il'n, Yurij V.; Tarasov, Il'ya S.comunicación de congreso
openAccessSOMI2009_3.pdf.jpg2009APPLYING THE JOINT WIGNER TIME‐FREQUENCY DISTRIBUTION TO CHARACTERIZATION OF TRAIN‐AVERAGE PARAMETERS INHERENT IN THE PULSED LIGHT RADIATION OF SEMICONDUCTOR HETEROLASERSShcherbakov, Alexandre S.; Moreno Zarate, Pedro; Campos Acosta, Joaquín CSIC ORCID CVN ; Il'n, Yurij V.; Tarasov, Il'ya S.comunicación de congreso
openAccessORENSE2009-4.pdf.jpg2009Applying the triple correlation functions to characterizing high-frequency repetition trains of picosecond optical pulsesMuñoz Zurita, Ana Luz; Shcherbakov, Alexandre S.; Campos Acosta, Joaquín CSIC ORCID CVN comunicación de congreso
closedAccessaccesoRestringido.pdf.jpg2012Automatic gonio-spectrophotometer for the absolute measurement of the spectral BRDF at in-out-of-plane and retroreflection geometriesRabal, Ana M. CSIC; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Fontecha, J. L. CSIC; Pons Aglio, Alicia CSIC ORCID; Rubiño, A. M.; Corróns, Antonio CSICartículo
closedAccessaccesoRestringido.pdf.jpg2014Bidirectional reflectance distribution function of diffuse reflectance standards around the retro-reflection directionRabal, Ana M. CSIC; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCID; Hernanz, María Luisa CSICartículo
openAccessBRDF0001.pdf.jpg13-jun-2017BRDF variability of typical diffuse reflectance standards between 380 nm and 1700 nmFerrero, Alejandro CSIC ORCID; Strothkämper, C.; Bernad, Berta CSIC; Quast, T.; Hauer, K.O.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCID; Schirmacher, A.póster de congreso
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