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RightsPreviewIssue DateTitleAuthor(s)Type
closedAccessaccesoRestringido.pdf.jpg30-Mar-20172D plasmonic diffractive patterns in metals by laser interferencePeláez, Ramón J. CSIC ORCID; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN comunicación de congreso
openAccess21-Jun-2021A facility for measuring the BSSRDFSantafé, Pablo; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Tejedor-Sierra, Néstor; Velázquez, J.L. CSIC ORCID CVNcomunicación de congreso
openAccess24-Jun-2014A new filter radiometer for the thermodynamic measurement of high temperature fixed pointsMantilla, J. M.; Martín, M. J.; Hernanz, María Luisa CSIC; Pons Aglio, Alicia CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Campo, D. delpóster de congreso
openAccessFerrero.pdf.jpg2013A single analytical model for sparkle and graininess patterns in texture of effect coatingsFerrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Rabal, A. M.; Pons Aglio, Alicia CSIC ORCIDartículo
openAccessAccounting for polarization–related.pdf.jpg13-Jul-2020Accounting for polarization-related effects in the measurement of the bidirectional reflectance distribution functionCalderón, A.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN artículo
openAccessCOMUNICACIONES_A_CONGRESOS293694[1].pdf.jpg2010An absolute radiometer based on InP photodiodesMuñoz Zurita, Ana Luz; Campos Acosta, Joaquín CSIC ORCID CVN ; Gómez Jiménez, Ramón; Uribe Valladares, Rodrigocomunicación de congreso
openAccesspresent capabilities.pdf.jpg5-Nov-2020An insight into the present capabilities of national metrology institutes for measuring sparkleFerrero, Alejandro CSIC ORCID; Basic, N.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pastuschek, M.; Perales, E.; Porrovecchio, G.; Šmid, M.; Schirmacher, A.; Velázquez, J.L. CSIC ORCID CVN; Martínez-Verdú, F.M.artículo
openAccess19-Jul-2016Análisis cromático de fuentes OLEDsVelázquez, J.L. CSIC ORCID CVN; Ferrero, Alejandro CSIC ORCID; Pons Aglio, Alicia CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Hernanz, María Luisa CSIC; Borreguero, E. CSIC; Bernard, Bertacomunicación de congreso
openAccessAngular and spectral radiant.pdf.jpg2012Angular and spectral radiant intensity distribution of high brightness white LEDsVillamarín, A.; Ferrero, Alejandro CSIC ORCID; Pons Aglio, Alicia CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Rabal, A.; Hernanz, María Luisa CSIC; Velázquez, J.L. CSIC ORCID CVN; Corróns, Antonio CSICartículo
closedAccessaccesoRestringido.pdf.jpg2003Anomalous non-linear behaviour of InGaAs photodiodes with overfilled illuminationCorredera, Pedro CSIC ORCID; Hernanz, María Luisa CSIC; González Herráez, Miguel; Campos Acosta, Joaquín CSIC ORCID CVN artículo
openAccess2006Apparent violation of the radiant exposure reciprocity law in interline CCDsFerrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCIDartículo
openAccessCOMUNICACIONES_A_CONGRESOS293722[1].pdf.jpg2010Applying the joint Wigner time-frequency distribution to characterization of ultra-short optical dissipative solitary pulses in the actively mode-locked semiconductor laser with an external single-mode fiber cavityShcherbakov, Alexandre S.; Moreno Zarate, Pedro; Campos Acosta, Joaquín CSIC ORCID CVN ; Il'n, Yurij V.; Tarasov, Il'ya S.comunicación de congreso
openAccessSOMI2009_3.pdf.jpg2009APPLYING THE JOINT WIGNER TIME‐FREQUENCY DISTRIBUTION TO CHARACTERIZATION OF TRAIN‐AVERAGE PARAMETERS INHERENT IN THE PULSED LIGHT RADIATION OF SEMICONDUCTOR HETEROLASERSShcherbakov, Alexandre S.; Moreno Zarate, Pedro; Campos Acosta, Joaquín CSIC ORCID CVN ; Il'n, Yurij V.; Tarasov, Il'ya S.comunicación de congreso
openAccessORENSE2009-4.pdf.jpg2009Applying the triple correlation functions to characterizing high-frequency repetition trains of picosecond optical pulsesMuñoz Zurita, Ana L.; Shcherbakov, Alexandre S.; Campos Acosta, Joaquín CSIC ORCID CVN comunicación de congreso
closedAccessaccesoRestringido.pdf.jpg2012Automatic gonio-spectrophotometer for the absolute measurement of the spectral BRDF at in-out-of-plane and retroreflection geometriesRabal, Ana M.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Fontecha, J. L.; Pons Aglio, Alicia CSIC ORCID; Rubiño, A. M.; Corróns, Antonio CSICartículo
closedAccessaccesoRestringido.pdf.jpg2014Bidirectional reflectance distribution function of diffuse reflectance standards around the retro-reflection directionRabal, Ana M.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCID; Hernanz, María Luisa CSICartículo
openAccessBRDF0001.pdf.jpg13-Jun-2017BRDF variability of typical diffuse reflectance standards between 380 nm and 1700 nmFerrero, Alejandro CSIC ORCID; Strothkämper, C.; Bernad, Berta CSIC; Quast, T.; Hauer, K.-O.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCID; Schirmacher, A.póster de congreso
openAccess25-Sep-2019Byko-Spectra effect light booth simulation for digital rendering toolHuraibat, Khalil; Perales, Esther; Viqueira, V.; Kirchner, Eric; Van der Lans, I.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN comunicación de congreso
openAccess2019Byko-Spectra effect light booth simulation for digital rendering toolHuraibat, Khalil; Perales, Esther; Viqueira, V.; Kirchner, Eric; Van der Lans, I.; Ferrero, Alejandro CSIC ORCID; Campos Acosta, Joaquín CSIC ORCID CVN capítulo de libro
openAccessV3_Calibrating the elements of a multispectral imaging system.pdf.jpgMay-2009Calibrating the elements of a multispectral imaging systemLópez-Álvarez, Miguel A.; Hernández-Andrés, Javier; Romero, Javier; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCIDartículo