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DerechosPreviewFecha Public.TítuloAutor(es)Tipo
1closedAccessaccesoRestringido.pdf.jpg15-jun-1992Carrier transport and storage in Si3N4 for metal-nitride-oxide-semiconductor memory applicationsMartín, Ferran; Aymerich, Xavier; Campabadal, Francesca CSIC ORCID ; Acero Leal, María Cruz CSIC ORCID artículo
2openAccesssse_dwsh.pdf.jpg1-ago-2001Hot-carrier degradation in deep-submicrometer nMOSFETs: Lightly doped drain vs. large angle tilt implanted drainRafí, J. M. CSIC ORCID ; Campabadal, Francesca CSIC ORCID artículo
3openAccessAdvanced Intelligent Systems - 2023 - Roldán - Variability in Resistive Memories.pdf.jpg1-jun-2023Variability in Resistive MemoriesRoldán, Juan B.; Miranda, Enrique; Maldonado, David; Mikhaylov, Alexey N.; Agudov, Nikolay V.; Dubkov, Alexander A.; Koryazhkina, Maria N.; González, Mireia B.; Villena, Marco A.; Poblador, Samuel CSIC ORCID ; Saludes-Tapia, Mercedes; Picos, Rodrigo; Jiménez-Molinos, Francisco; Stavrinides, Stavros G.; Salvador, Emili; Alonso, Francisco J.; Campabadal, Francesca CSIC ORCID ; Spagnolo, Bernardo; Lanza, Mario; Chua, Leon O.revisión
4openAccessdwshop99_p26.pdf.jpg1-abr-2000Hot carrier reliability in deep-submicrometer LATID NMOSFETsRafí, J. M. CSIC ORCID ; Campabadal, Francesca CSIC ORCID artículo
5closedAccess4-feb-2007Characterization of edgeless detectors fabricated by dry etching processPellegrini, Giulio CSIC ORCID; Campabadal, Francesca CSIC ORCID ; Lozano Fantoba, Manuel CSIC ORCID ; Martí García, Salvador; Miñano, Mercedes CSIC ORCID; Rafí, J. M. CSIC ORCID ; Ullán Comes, Miguel artículo
6openAccessManuscript_#SSE-D-11-00531_revised_version_with_all_changes_accepted_vfinal.pdf.jpg20132 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O <inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectricsRafí, J. M. CSIC ORCID ; Campabadal, Francesca CSIC ORCID ; Ohyama, H.; Takakura, K.; Tsunoda, I.; Zabala, Miguel; Beldarrain, O.; González, M. B.; García, H.; Castán, H.; Gómez, A.; Dueñas, S.artículo
7openAccessjmrafi_EUROSOI_2007_SSE_revised_vfinal.pdf.jpg2007Gate induced floating body effects in TiN/SiON and TiN/HfO<inf>2</inf> gate stack triple gate SOI nFinFETsRafí, J. M. CSIC ORCID ; Simoen, E.; Mercha, A.; Collaert, Nadine; Hayama, K.; Campabadal, Francesca CSIC ORCID ; Claeys, C.artículo
8openAccessTrue_Random_Number_Generator_Based_on_the_Variability_of_the_High_Resistance_State_of_RRAMs.pdf.jpg1-ene-2023True Random Number Generator Based on the Variability of the High Resistance State of RRAMsAkbari, Maryam; Mirzakuchaki, Sattar; Arumí, Daniel; Manich, Salvador; Gómez-Pau, Alvaro; Campabadal, Francesca CSIC ORCID ; González, Mireia Bargalló; Rodríguez-Montañés, Rosaartículo
9openAccess1-sep-2023Impact of the W etching process on the resistive switching properties of TiN/Ti/HfO<inf>2</inf>/W memristorsSaludes-Tapia, Mercedes; Campabadal, Francesca CSIC ORCID ; Miranda, Enrique A.; González Bargallo, Mireiaartículo
10openAccessdwshop99_p26.pdf.jpg1-abr-2000Hot-carrier reliability in deep-submicrometer LATID NMOSFETsRafí, J. M. CSIC ORCID ; Campabadal, Francesca CSIC ORCID artículo