English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/93704
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Title

Controlled positioning of nanoparticles on graphene by noninvasive AFM lithography

AuthorsBellido, Elena ; Ojea-Jiménez, Isaac ; Ghirri, Alberto; Alvino, Christian; Candini, Andrea; Puntes, Víctor F. ; Domingo, Neus ; Ruiz Molina, Daniel
Issue Date2012
PublisherAmerican Chemical Society
CitationLangmuir 28(33): 12400-12409 (2012)
AbstractAtomic force microscopy is shown to be an excellent lithographic technique to directly deposit nanoparticles on graphene by capillary transport without any previous functionalization of neither the nanoparticles nor the graphene surface while preserving its integrity and conductivity properties. Moreover this technique allows for (sub)micrometric control on the positioning thanks to a new three-step protocol that has been designed with this aim. With this methodology the exact target coordinates are registered by scanning the tip over the predetermined area previous to its coating with the ink and deposition. As a proof-of-concept, this strategy has successfully allowed the controlled deposition of few nanoparticles on 1 μm 2 preselected sites of a graphene surface with high accuracy. © 2012 American Chemical Society.
URIhttp://hdl.handle.net/10261/93704
DOI10.1021/la3023419
Identifiersdoi: 10.1021/la3023419
issn: 0743-7463
e-issn: 1520-5827
Appears in Collections:(CIN2) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.