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Efficient selection of signatures for analog/RF alternate test

AuthorsBarragán, Manuel J. ; Léger, G.
Issue Date2013
PublisherInstitute of Electrical and Electronics Engineers
Citation18th IEEE European Test Symposium: 1-6 (2013)
AbstractThis work proposes a generic methodology for selecting meaningful subsets of indirect measurements (signatures). This allows precise predictions of the DUT performances and/or precise pass/fail classification of the DUT, while minimizing the number of necessary measurements. Two simple figures of merit are provided for ranking sets of signatures a priori, before training any machine learning model. These two figures evaluate the quality of each signature based on its Brownian distance correlation to the target specifications, and on its local distribution in the proximities of the pass/fail decision boundaries. The proposed methodology is illustrated by its direct application to a DC-based alternate test for LNAs.
DescriptionTrabajo presentado al 18th ETS celebrado en Francia del 27 al 30 de mayo de 2013.
Publisher version (URL)http://dx.doi.org/10.1109/ETS.2013.6569362
Appears in Collections:(IMSE-CNM) Libros y partes de libros
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