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Title

Laser tests of silicon detectors

AuthorsDolezal, Z.; Escobar, Carlos CSIC ORCID ; Gadomski, S.; García García, Carmen CSIC ORCID; González Sevilla, Sergio CSIC; Kodys, P.; Kubik, P.; Lacasta Llácer, Carlos CSIC ORCID ; Martí García, Salvador CSIC ORCID; Mitsou, Vasiliki A. CSIC ORCID ; Moorhead, G. F.; Phillips, P. W.; Reznicek, P.; Slavik, R.
KeywordsSemiconductor detectors
Laser tests
[PACS] Solid-state detectors
[PACS] Optical testing techniques
[PACS] Methods of materials testing and analysis
Issue Date1-Apr-2007
PublisherElsevier
CitationNuclear Instruments & Methods in Physics Research Section A - Accelerators, Spectrometers, Detectors and Associated Equipment 573(1-2): 12-15 (2007)
AbstractThis paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.
Description4 pages, 5 figures.-- PACS nrs.: 29.40.W; 42.87; 81.70.-- ISI Article Identifier: 000245624200005.-- Issue title: Proceedings of the 7th International Conference on Position-Sensitive Detectors - PSD-7, 7th International Conference on Position-Sensitive Detectors.
Available online 29 November 2006.
Publisher version (URL)http://dx.doi.org/10.1016/j.nima.2006.10.319
URIhttp://hdl.handle.net/10261/9127
DOI10.1016/j.nima.2006.10.319
ISSN0168-9002
Appears in Collections:(IFIC) Artículos

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