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dc.contributor.authorScheres, Sjors H. W.-
dc.contributor.authorNúñez-Ramírez, Rafael-
dc.contributor.authorSánchez Sorzano, Carlos Óscar-
dc.contributor.authorCarazo, José M.-
dc.contributor.authorMarabini, Roberto-
dc.date.accessioned2008-11-20T10:32:16Z-
dc.date.available2008-11-20T10:32:16Z-
dc.date.issued2008-05-15-
dc.identifier.citationNature Protocols 3: 977-990 (2008)en_US
dc.identifier.issn1754-2189-
dc.identifier.urihttp://hdl.handle.net/10261/8705-
dc.description14 pages.-- PMID: 18536645 [PubMed].en_US
dc.description.abstractWe describe a collection of standardized image processing protocols for electron microscopy single-particle analysis using the XMIPP software package. These protocols allow performing the entire processing workflow starting from digitized micrographs up to the final refinement and evaluation of 3D models. A particular emphasis has been placed on the treatment of structurally heterogeneous data through maximum-likelihood refinements and self-organizing maps as well as the generation of initial 3D models for such data sets through random conical tilt reconstruction methods. All protocols presented have been implemented as stand-alone, executable python scripts, for which a dedicated graphical user interface has been developed. Thereby, they may provide novice users with a convenient tool to quickly obtain useful results with minimum efforts in learning about the details of this comprehensive package. Examples of applications are presented for a negative stain random conical tilt data set on the hexameric helicase G40P and for a structurally heterogeneous data set on 70S Escherichia coli ribosomes embedded in vitrified ice.en_US
dc.format.extent473166 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoengen_US
dc.publisherNature Publishing Groupen_US
dc.rightsclosedAccessen_US
dc.subjectBiomedical imagingen_US
dc.subjectImage processingen_US
dc.subjectComputational and theoretical biologyen_US
dc.subjectSpectroscopy and structural analysisen_US
dc.titleImage processing for electron microscopy single-particle analysis using XMIPPen_US
dc.typeartículoen_US
dc.identifier.doi10.1038/nprot.2008.62-
dc.description.peerreviewedPeer revieweden_US
dc.relation.publisherversionhttp://dx.doi.org/10.1038/nprot.2008.62en_US
dc.identifier.e-issn1750-2799-
Appears in Collections:(CNB) Artículos
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