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Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell

AuthorsHuertas, Gloria ; Vázquez, Diego ; Peralías, E. ; Rueda, Adoración ; Huertas-Díaz, J. L.
Issue Date2002
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Design and Test of Computers 19(6): 73-82 (2002)
AbstractA formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is to offer designers testing options that do not have significant area overhead, performance degradation, or test time. This work shows that OBT is a potential candidate for IP providers to use in combination with functional test techniques. We have shown how to modify the basic concept of OBT to come up with a practical method. Using our approach, designers can use OBT to pave the way for future developments in SoC testing, and it is simple to extend this idea to BIST.
Publisher version (URL)http://dx.doi.org/10.1109/MDT.2002.1047746
Identifiersdoi: 10.1109/MDT.2002.1047746
issn: 0740-7475
Appears in Collections:(IMSE-CNM) Artículos
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