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Substrate-enhanced infrared near-field spectroscopy

AuthorsAizpurua, Javier ; Taubner, Thomas; García de Abajo, Francisco Javier ; Brehm, Markus; Hillenbrand, Rainer
Keywords[OCIS] Optics at surfaces: Spectroscopy, surface
[OCIS] Spectroscopy: Spectroscopy, infrared
[OCIS] Microscopy: Near-field microscopy
[OCIS] Scattering: Scattering theory
Issue Date22-Jan-2008
PublisherOptical Society of America
CitationOptics Express 16(3): 1529-1545 (2008)
AbstractWe study the amplitude and phase signals detected in infrared scattering-type near field optical microscopy (s-SNOM) when probing a thin sample layer on a substrate. We theoretically describe this situation by solving the electromagnetic scattering of a dipole near a planar sample consisting of a substrate covered by thin layers. We perform calculations to describe the effect of both weakly (Si and SiO2) and strongly (Au) reflecting substrates on the spectral s-SNOM signal of a thin PMMA layer. We theoretically predict, and experimentally confirm an enhancement effect in the polymer vibrational spectrum when placed on strongly reflecting substrates. We also calculate the scattered fields for a resonant tip-substrate interaction, obtaining a dramatic enhancement of the signal amplitude and spectroscopic contrast of the sample layer, together with a change of the spectral line shape. The enhanced contrast opens the possibility to perform ultra-sensitive near field infrared spectroscopy of monolayers and biomolecules.
Description17 pages, 8 figures.-- OCIS codes: 240.6490, 300.6340, 180.4243, 290.5825.-- © 2008 Optical Society of America.
Publisher version (URL)http://dx.doi.org/10.1364/OE.16.001529
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