Por favor, use este identificador para citar o enlazar a este item:
http://hdl.handle.net/10261/74648
COMPARTIR / EXPORTAR:
SHARE CORE BASE | |
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Título: | Attenuation lengths of high energy photoelectrons in compact and mesoporous SiO2 films |
Autor: | Ferrer, F. J. CSIC ORCID; Gil-Rostra, J. CSIC ORCID; González-García, Lola; Rubio-Zuazo, J. CSIC ORCID; Romero-Gómez, Pablo CSIC; López-Santos, Carmen CSIC ORCID; Yubero, Francisco CSIC ORCID | Fecha de publicación: | 2012 | Editor: | Elsevier | Citación: | Surface Science 606(9-10): 820-824 (2012) | Resumen: | We have experimentally evaluated attenuation lengths (AL) of photoelectrons traveling in compact and micro and mesoporous (∼ 45% voids) SiO 2 thin films with high (8.2-13.2 keV) kinetic energies. The films were grown on polished Si(100) wafers. ALs were deduced from the intensity ratio of the Si 1s signal from the SiO 2 film and Si substrate using the two-peaks overlayer method. We obtain ALs of 15-22 nm and 23-32 nm for the compact and porous SiO 2 films for the range of kinetic energies considered. The observed AL values follow a power law dependence on the kinetic energy of the electrons where the exponent takes the values 0.81 ± 0.13 and 0.72 ± 0.12 for compact and porous materials, respectively. © 2012 Elsevier B.V. All rights reserved. | Descripción: | El pdf del artículo es la versión post-print. | Versión del editor: | http://dx.doi.org/10.1016/j.susc.2012.01.017 | URI: | http://hdl.handle.net/10261/74648 | DOI: | 10.1016/j.susc.2012.01.017 | Identificadores: | doi: 10.1016/j.susc.2012.01.017 issn: 0039-6028 |
Aparece en las colecciones: | (ICMS) Artículos (CNA) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
---|---|---|---|---|
Postprint of Surface Science .pdf | 513,26 kB | Adobe PDF | Visualizar/Abrir |
CORE Recommender
SCOPUSTM
Citations
1
checked on 18-abr-2024
WEB OF SCIENCETM
Citations
1
checked on 23-feb-2024
Page view(s)
325
checked on 24-abr-2024
Download(s)
244
checked on 24-abr-2024
Google ScholarTM
Check
Altmetric
Altmetric
NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.