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dc.contributor.authorOrtiz, G.-
dc.contributor.authorGarcía-García, A.-
dc.contributor.authorBiziere, N.-
dc.contributor.authorBoust, F.-
dc.contributor.authorBobo, J. F.-
dc.contributor.authorSnoeck, E.-
dc.date.accessioned2013-04-04T09:41:02Z-
dc.date.available2013-04-04T09:41:02Z-
dc.date.issued2013-
dc.identifierdoi: 10.1063/1.4789801-
dc.identifierissn: 0021-8979-
dc.identifiere-issn: 1089-7550-
dc.identifier.citationJournal of Applied Physics 113(4): 043921 (2013)-
dc.identifier.urihttp://hdl.handle.net/10261/73585-
dc.description.abstractWe report detailed structural characterization and magneto-optical Kerr magnetometry measurements at room temperature in epitaxial Co2MnSi thin films grown on MgO(001) and Cr(001) buffered MgO single crystals prepared by sputtering. While Co2MnSi/Cr//MgO(001) films display the expected cubic anisotropy, the magnetization curves obtained for Co2MnSi// MgO(001) samples exhibit a superimposed in-plane uniaxial magnetic anisotropy. The evolution of magnetization with film thickness points to a relevant interfacial Co2MnSi-buffer layer (Cr or MgO) contribution which competes with magnetic properties of bulk Co2MnSi, resulting in a drastic change in the magnetism of the whole sample. The origin of this interfacial magnetic anisotropy is discussed and correlated with our structural studies. © 2013 American Institute of Physics.-
dc.description.sponsorshipA. García-García would like to acknowledge the Fundaçao para a Ciencia e Tecnologia (FCT) for his postdoctoral grant (Grant No. SFRH/BPD/817102011).-
dc.language.isoeng-
dc.publisherAmerican Institute of Physics-
dc.relation.isversionofPublisher's version-
dc.rightsopenAccess-
dc.titleGrowth, structural, and magnetic characterization of epitaxial Co2MnSi films deposited on MgO and Cr seed layers-
dc.typeartículo-
dc.identifier.doi10.1063/1.4789801-
dc.relation.publisherversionhttp://dx.doi.org/10.1063/1.4789801-
dc.date.updated2013-04-04T09:41:02Z-
dc.description.versionPeer Reviewed-
dc.contributor.funderFundação para a Ciência e a Tecnologia (Portugal)-
dc.relation.csic-
dc.identifier.funderhttp://dx.doi.org/10.13039/501100001871es_ES
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