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Title

On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits

AuthorsVázquez, Diego ; Huertas, Gloria ; Léger, G. ; Peralías, E. ; Rueda, Adoración ; Huertas-Díaz, J. L.
Issue Date2002
PublisherSpringer
CitationAnalog Integrated Circuits and Signal Processing 33(2): 201–211 (2002)
AbstractThis work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approach
DescriptionEl pdf del artículo es la versión pre-print.
Publisher version (URL)http://dx.doi.org/10.1023/A:1021276218012
URIhttp://hdl.handle.net/10261/61793
DOI10.1023/A:1021276218012
ISSN0925-1030
Appears in Collections:(IMSE-CNM) Artículos
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