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Open Access item On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits

Authors:Vázquez, Diego
Huertas, Gloria
Léger, G.
Peralías, E.
Rueda, Adoración
Huertas-Díaz, J. L.
Issue Date:2002
Citation:Analog Integrated Circuits and Signal Processing 33(2): 201–211 (2002)
Abstract:This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approach
Description:El pdf del artículo es la versión pre-print.
Publisher version (URL):http://dx.doi.org/10.1023/A:1021276218012
Appears in Collections:(IMS-CNM) Artículos

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