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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/61793
Title: On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits
Authors: Vázquez, Diego; Huertas, Gloria; Léger, G.; Peralías, E.; Rueda, Adoración; Huertas-Díaz, J. L.
Issue Date: 2002
Publisher: Springer
Citation: Analog Integrated Circuits and Signal Processing 33(2): 201–211 (2002)
Abstract: This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approach
Description: El pdf del artículo es la versión pre-print.
Publisher version (URL): http://dx.doi.org/10.1023/A:1021276218012
URI: http://hdl.handle.net/10261/61793
ISSN: 0925-1030
DOI: 10.1023/A:1021276218012
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