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Título : Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators
Autor : Léger, G., Rueda, Adoración
Fecha de publicación : 2004
Editor: Institute of Electrical and Electronics Engineers
Resumen: This paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator leakage is known to be related to the converter precision and belongs to the basic set of design specifications. The technique proposed here involves very few hardware, which makes it specially suitable for Built-In Self-Test (BIST) implementation. Moreover, the integrator leakage evaluation allows its digital correction in cascaded modulators.
Descripción : El pdf del artículo es la versión post-print.
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ISSN: 1350-2409
DOI: 10.1049/ip-cds:20040558(410)151
Citación : IEE Proceedings Circuits, Devices and Systems 151(4): 349–358 (2004)
Appears in Collections:(IMS-CNM) Artículos

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