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Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators

AuthorsLéger, G. ; Rueda, Adoración
Issue Date2004
PublisherInstitute of Electrical and Electronics Engineers
CitationIEE Proceedings Circuits, Devices and Systems 151(4): 349–358 (2004)
AbstractThis paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator leakage is known to be related to the converter precision and belongs to the basic set of design specifications. The technique proposed here involves very few hardware, which makes it specially suitable for Built-In Self-Test (BIST) implementation. Moreover, the integrator leakage evaluation allows its digital correction in cascaded modulators.
DescriptionEl pdf del artículo es la versión post-print.
Publisher version (URL)http://dx.doi.org/10.1049/ip-cds:20040558(410)%20151
Appears in Collections:(IMSE-CNM) Artículos
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