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dc.contributor.authorLeger, Gildas-
dc.contributor.authorRueda, Adoración-
dc.date.accessioned2012-11-12T16:12:40Z-
dc.date.available2012-11-12T16:12:40Z-
dc.date.issued2009-
dc.identifier.citationIEEE Transactions on Circuits and Systems I: Regular Papers 56(7): 1326-1338 (2009)es_ES
dc.identifier.issn1549-8328-
dc.identifier.urihttp://hdl.handle.net/10261/60026-
dc.description.abstractThe test of SigmaDelta modulators is cumbersome due to the high performance that they reach. Moreover, technology scaling trends raise serious doubts on the intradie repeatability of devices. An increase of variability will lead to an increase in parametric faults that are difficult to detect. In this paper, a design-oriented testing approach is proposed to perform a simple and low-cost detection of variations in important design variables of cascaded SigmaDelta modulators. The digital tests could be integrated in a production test flow to improve fault coverage and bring data for silicon debug. A study is presented to tailor signature generation, with test-time minimization in mind, as a function of the desired measurement precision. The developments are supported by experimental results that validate the proposal.es_ES
dc.description.sponsorshipThis work has been partially funded by the Junta de Andalucía project EXC/2005/TIC-927 and by the Spanish Government project TEC-2007-68072.es_ES
dc.language.isoenges_ES
dc.publisherInstitute of Electrical and Electronics Engineerses_ES
dc.rightsopenAccesses_ES
dc.subjectΣΔ modulationes_ES
dc.subjectDesign for testabilityes_ES
dc.titleLow-cost digital detection of parametric faults in cascaded ΣΔ modulatorses_ES
dc.typeartículoes_ES
dc.identifier.doi10.1109/TCSI.2008.2006648-
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1109/TCSI.2008.2006648es_ES
Appears in Collections:(IMSE-CNM) Artículos
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