Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/60026
Share/Impact:
Título : Low-cost digital detection of parametric faults in cascaded ΣΔ modulators
Autor : Léger, G., Rueda, Adoración
Palabras clave : ΣΔ modulation
Design for testability
Fecha de publicación : 2009
Editor: Institute of Electrical and Electronics Engineers
Citación : IEEE Transactions on Circuits and Systems I: Regular Papers 56(7): 1326-1338 (2009)
Resumen: The test of SigmaDelta modulators is cumbersome due to the high performance that they reach. Moreover, technology scaling trends raise serious doubts on the intradie repeatability of devices. An increase of variability will lead to an increase in parametric faults that are difficult to detect. In this paper, a design-oriented testing approach is proposed to perform a simple and low-cost detection of variations in important design variables of cascaded SigmaDelta modulators. The digital tests could be integrated in a production test flow to improve fault coverage and bring data for silicon debug. A study is presented to tailor signature generation, with test-time minimization in mind, as a function of the desired measurement precision. The developments are supported by experimental results that validate the proposal.
Versión del editor: http://dx.doi.org/10.1109/TCSI.2008.2006648
URI : http://hdl.handle.net/10261/60026
ISSN: 1549-8328
DOI: 10.1109/TCSI.2008.2006648
Appears in Collections:(IMS-CNM) Artículos

Files in This Item:
File Description SizeFormat 
Low-cost digital.pdf844,37 kBAdobe PDFView/Open
Show full item record
 
CSIC SFX LinksSFX Query


Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.