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Correlation lengths, porosity and water adsorption in TiO 2 thin films prepared by glancing angle deposition

AuthorsGonzález-García, L.; González-García, Lola; Parra-Barranco, J. ; Sánchez Valencia, Juan Ramón; Barranco, Ángel ; Borrás, Ana ; González-Elipe, Agustín R. ; García-Gutiérrez, Mari Cruz ; Hernández, Jaime J.; Rueda, Daniel R. ; Ezquerra, Tiberio A.
Issue Date2012
PublisherInstitute of Physics Publishing
CitationNanotechnology 23: 205701 (2012)
AbstractThis paper reports a thorough microstructural characterization of glancing angle deposited (GLAD) TiO 2 thin films. Atomic force microscopy (afm), grazing-incidence small-angle x-ray scattering (GISAXS) and water adsorption isotherms have been used to determine the evolution of porosity and the existence of some correlation distances between the nanocolumns constituting the basic elements of the films nanostructure. It is found that the deposition angle and, to a lesser extent, the film thickness are the most important parameters controlling properties of the thin film. The importance of porosity and some critical dimensions encountered in the investigated GLAD thin films is highlighted in relation to the analysis of their optical properties when utilized as antireflective coatings or as hosts and templates for the development of new composite materials. © 2012 IOP Publishing Ltd.
Identifiersdoi: 10.1088/0957-4484/23/20/205701
issn: 0957-4484
Appears in Collections:(CFMAC-IEM) Artículos
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