Por favor, use este identificador para citar o enlazar a este item:
http://hdl.handle.net/10261/56705
COMPARTIR / EXPORTAR:
SHARE CORE BASE | |
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Título: | Early stages of laser mixing process in Sb/Ge multilayer thin films |
Autor: | Serna, Rosalía CSIC ORCID ; Afonso, Carmen N. CSIC ; Petford-Long, Amanda K.; Long, N.J. | Fecha de publicación: | 1993 | Editor: | Springer Nature | Citación: | Applied Physics A: Materials Science and Processing 56: 132- 137 (1993) | Resumen: | The onset of mixing at the interfaces between Sb and Ge in thin multilayered films containing two or four layers has been studied. The films were irradiated with nanosecond laser pulses in order to trigger mixing, and in situ reflectivity measurements were used to follow the transformation in real-time. Cross sectional transmission electron microscopy analysis was used to study both the structure and the composition profile before and after irradiation. A threshold irradiation energy exists for the onset of mixing, below which roughening of the interface between the layers is observed, together with recrystallization of the surface Sb layer following melting. The results are consistent with a melting/diffusion process which is inhomogeneously nucleated at the interface between the top Sb and Ge layers. Once mixing is initiated an amorphous Sb-Ge layer of constant thickness is formed, corresponding to mixing along a well defined planar melt front. Voids are observed at the former Sb/Ge interface, which may be related to interfacial stress in the as-grown configuration. © 1993 Springer-Verlag. | URI: | http://hdl.handle.net/10261/56705 | DOI: | 10.1007/BF00517680 | Identificadores: | doi: 10.1007/BF00517680 issn: 0947-8396 |
Aparece en las colecciones: | (CFMAC-IO) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
---|---|---|---|---|
accesoRestringido.pdf | 15,38 kB | Adobe PDF | Visualizar/Abrir |
CORE Recommender
SCOPUSTM
Citations
9
checked on 21-abr-2024
WEB OF SCIENCETM
Citations
9
checked on 19-feb-2024
Page view(s)
252
checked on 24-abr-2024
Download(s)
96
checked on 24-abr-2024
Google ScholarTM
Check
Altmetric
Altmetric
NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.