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Open Access item OBT for settling error test of sampled-data systems using signal-dependent clocking

Authors:Barragán, Manuel J.
Léger, G.
Huertas-Díaz, J. L.
Issue Date:2012
Publisher:Institute of Electrical and Electronics Engineers
Citation:17th IEEE European Test Symposium (ETS): 1-6 (2012)
Abstract:This work presents a modification of traditional Oscillation-Based Test schemes for sampled-data systems. This new test scheme is based on doubling the sampling frequency when the oscillation changes its sign. This way, the DC level of the output oscillation signal becomes a simple signature sensitive to the settling errors in the device under test and to its oscillation features. The proposed technique is illustrated on a switched- capacitor second-order lowpass filter. This case study is used to show the sensitivity of the proposed signature to the linearity of the DUT. Electrical simulation results are provided to validate the proposal.
Description:Comunicación presentada al "17th ETS-2012" celebrado en Annecy (Francia) del 28 al 31 de Mayo del 2012.
Publisher version (URL):http://dx.doi.org/10.1109/ETS.2012.6233013
Appears in Collections:(IMS-CNM) Libros y partes de libros

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