English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/56139
logo share SHARE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

OBT for settling error test of sampled-data systems using signal-dependent clocking

AuthorsBarragán, Manuel J. ; Léger, G. ; Huertas-Díaz, J. L.
Issue Date2012
PublisherInstitute of Electrical and Electronics Engineers
Citation17th IEEE European Test Symposium (ETS): 1-6 (2012)
AbstractThis work presents a modification of traditional Oscillation-Based Test schemes for sampled-data systems. This new test scheme is based on doubling the sampling frequency when the oscillation changes its sign. This way, the DC level of the output oscillation signal becomes a simple signature sensitive to the settling errors in the device under test and to its oscillation features. The proposed technique is illustrated on a switched- capacitor second-order lowpass filter. This case study is used to show the sensitivity of the proposed signature to the linearity of the DUT. Electrical simulation results are provided to validate the proposal.
DescriptionComunicación presentada al "17th ETS-2012" celebrado en Annecy (Francia) del 28 al 31 de Mayo del 2012.
Publisher version (URL)http://dx.doi.org/10.1109/ETS.2012.6233013
Appears in Collections:(IMSE-CNM) Libros y partes de libros
Files in This Item:
File Description SizeFormat 
ETS2012_postprint.pdf563,69 kBAdobe PDFThumbnail
Show full item record
Review this work

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.