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Structural and optical characterisation of planar waveguides obtained via sol-gel

AuthorsRey-García, F.; Gómez-Reino, Carlos; Flores Arias, M. Teresa; Fuente, Germán F. de la
KeywordsPlanar waveguides
Sol-gel technology
Transmission electron microscopy
Issue DateJul-2011
PublisherSociety of Photo-Optical Instrumentation Engineers
CitationProc. of SPIE 8001: 800116 (2011)
AbstractPlanar waveguides of SiO2:TiO2 (multilayer structure) and SiO2:CeO2 (thick layer) were prepared onto commercial glass substrates using a sol-gel technique combined with dip-coating. These glassy coatings were structural characterised by Transmission Electron Microscopy (TEM) Energy Dispersive X-ray analysis and by Confocal Microscopy. Thicknesses of 1230 nm and 4,15 μm and refractive indices of 1.59 and 1.48 for SiO2:TiO2 (70:30) and SiO2:CeO2 (95:5) waveguides were obtained, respectively, by Spectroscopic Ellypsometry. Losses of 0.8 dB/cm were measured by double prism method in the SiO2:CeO2 system.
Description8 páginas, 6 figuras, 1 tabla.-- Trabajo presentado a la "International Conference on Applications of Optics and Photonics" celebrada en Braga (Portugal) en Mayo del 2011.
Publisher version (URL)http://dx.doi.org/10.1117/12.891941
Appears in Collections:(ICMA) Comunicaciones congresos
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