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Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam

AuthorsMartínez, Javier ; Yuzvinsky, T. D.; Fennimore, A. M.; Zettl, A.; García, Rafael; Bustamante, C.
Issue Date2005
PublisherInstitute of Physics Publishing
CitationNanotechnology 16: 2493-2496 (2005)
AbstractWe report on the precise positioning of a carbon nanotube on an atomic force microscope (AFM) tip. By using a nanomanipulator inside a scanning electron microscope, an individual nanotube was retrieved from a metal foil by the AFM tip. The electron beam allows us to control the nanotube length and to sharpen its end. The performance of these tips for AFM imaging is demonstrated by improved lateral resolution of DNA molecules. © 2005 IOP Publishing Ltd.
Identifiersdoi: 10.1088/0957-4484/16/11/004
issn: 0957-4484
Appears in Collections:(IMN-CNM) Artículos
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