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Título

Sub-50 nm positioning of organic compounds onto silicon oxide patterns fabricated by local oxidation nanolithography

AutorLosilla, N. S.; Oxtoby, Neil S. CSIC; Martínez Rodrigo, Javier CSIC ORCID; García-Pérez, Fernando CSIC; García García, Ricardo CSIC ORCID; Mas Torrent, Marta CSIC ORCID; Veciana, Jaume CSIC ORCID CVN; Rovira, Concepció CSIC ORCID
Fecha de publicación8-oct-2008
EditorInstitute of Physics Publishing
CitaciónNanotechnology 19: 455308 (2008)
ResumenWe present a process to fabricate molecule-based nanostructures by merging a bottom-up interaction and a top-down nanolithography. Direct nanoscale positioning arises from the attractive electrostatic interactions between the molecules and silicon dioxide nanopatterns. Local oxidation nanolithography is used to fabricate silicon oxide domains with variable gap separations ranging from 40 nm to several microns in length. We demonstrate that an ionic tetrathiafulvalene (TTF) semiconductor can be directed from a macroscopic liquid solution (1 μM) and selectively deposited onto predefined nanoscale regions of a 1 cm2 silicon chip with an accuracy of 40 nm.
Versión del editorhttp://dx.doi.org/10.1088/0957-4484/19/45/455308
URIhttp://hdl.handle.net/10261/47584
DOI10.1088/0957-4484/19/45/455308
ISSN0957-4484
Aparece en las colecciones: (IMN-CNM) Artículos




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