Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/47472
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Título : Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy– magnetic force microscopy combination
Autor : Jaafar, Miriam, Iglesias-Freire, Óscar, Serrano-Ramón, Luis, Ibarra, M. Ricardo, Teresa, José María de, Asenjo, Agustina
Palabras clave : Electrostatic interaction
Focused electron beam induced deposition
Kelvin probe force microscopy
Magnetic force microscopy
Fecha de publicación : Sep-2011
Editor: Beilstein-Institut zur Förderung der Chemischen Wissenschaften
Citación : Beilstein journal of nanotechnology 2: 552-560 (2011)
Resumen: The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topography and the magnetic signal by scanning at a lift distance of 25–50 nm such that the long range tip–sample interactions dominate. Nowadays, MFM is becoming a valuable technique to detect weak magnetic fields arising from low dimensional complex systems such as organic nanomagnets, superparamagnetic nanoparticles, carbon-based materials, etc. In all these cases, the magnetic nanocomponents and the substrate supporting them present quite different electronic behavior, i.e., they exhibit large surface potential differences causing heterogeneous electrostatic interaction between the tip and the sample that could be interpreted as a magnetic interaction. To distinguish clearly the origin of the tip–sample forces we propose to use a combination of Kelvin probe force microscopy (KPFM) and MFM. The KPFM technique allows us to compensate in real time the electrostatic forces between the tip and the sample by minimizing the electrostatic contribution to the frequency shift signal. This is a great challenge in samples with low magnetic moment. In this work we studied an array of Co nanostructures that exhibit high electrostatic interaction with the MFM tip. Thanks to the use of the KPFM/MFM system we were able to separate the electric and magnetic interactions between the tip and the sample.
Descripción : 9 páginas, 4 figuras, 1 tabla.-- This is an Open Access article under the terms of the Creative Commons Attribution License.
Versión del editor: http://dx.doi.org/10.3762/bjnano.2.59
URI : http://hdl.handle.net/10261/47472
DOI: 10.3762/bjnano.2.59
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