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dc.contributor.authorAlberdi, J.-
dc.contributor.authorArce, Pedro-
dc.contributor.authorCalderon, Alicia-
dc.contributor.authorGómez, G.-
dc.contributor.authorGonzález Sánchez, J.-
dc.contributor.authorMartínez-Rivero, Celso-
dc.contributor.authorMatorras, Francisco-
dc.contributor.authorRodrigo, Teresa-
dc.contributor.authorMartínez Ruiz del Arbol, P.-
dc.contributor.authorSobron Sañudo, M.-
dc.contributor.authorVila, Iván-
dc.contributor.authorLópez Virto, A.-
dc.contributor.authorFerrando, A.-
dc.date.accessioned2012-02-28T13:37:02Z-
dc.date.available2012-02-28T13:37:02Z-
dc.date.issued2010-12-
dc.identifier.citationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 624(1): 73-77 (2010)es_ES
dc.identifier.issn0168-9002-
dc.identifier.urihttp://hdl.handle.net/10261/46347-
dc.description5 páginas, 4 figuras, 4 tablas.-- et al.es_ES
dc.description.abstractThis document presents an application of the new generation of amorphous silicon position detecting (ASPD) sensors to multipoint alignment. Twelve units are monitored along a 20m long laser beam, where the light path is deflected by 901 using a pentaprism.es_ES
dc.language.isoenges_ES
dc.publisherElsevieres_ES
dc.rightsclosedAccesses_ES
dc.titleMultipoint alignment monitoring with amorphous silicon position detectors in a complex light pathes_ES
dc.typeartículoes_ES
dc.identifier.doi10.1016/j.nima.2010.09.008-
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.nima.2010.09.008es_ES
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