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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/45088
Title: Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAs
Authors: Barragán, Manuel J.; Fiorelli, R.; Léger, G.; Rueda, Adoración; Huertas-Díaz, J. L.
Issue Date: Nov-2011
Publisher: Institute of Electrical and Electronics Engineers
Citation: 20th Asian Test Symposium (ATS): 359-364 (2011)
Abstract: This work demonstrates that multi-VDD conditions may be used to improve the accuracy of machine learning mod- els, significantly decreasing the prediction error. The proposed technique has been successfully applied to a previous alternate test strategy for LNAs based on response envelope detection. A prototype has been developed to show its feasibility. The prototype consists of a low-power 2.4GHz LNA and a simple envelope detector, integrated in a 90nm CMOS technology. Post- layout simulation results are provided to verify the functionality of the approach. Copyright © 2011 IEEE.
Description: Trabajo presentado al "20 Asina Test Symposium" celebrado en Nueva Delhi (India) del 20 al 23 de Noviembre del 2011.-- Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the products or services of CSIC Spanish National Research Council, Digital.CSIC. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
Publisher version (URL): http://dx.doi.org/10.1109/ATS.2011.15
URI: http://hdl.handle.net/10261/45088
ISBN: 978-1-4577-1984-4
DOI: 10.1109/ATS.2011.15
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