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Título

Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAs

AutorBarragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Leger, Gildas CSIC ORCID ; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC
Fecha de publicaciónnov-2011
EditorInstitute of Electrical and Electronics Engineers
Citación20th Asian Test Symposium (ATS): 359-364 (2011)
ResumenThis work demonstrates that multi-VDD conditions may be used to improve the accuracy of machine learning mod- els, significantly decreasing the prediction error. The proposed technique has been successfully applied to a previous alternate test strategy for LNAs based on response envelope detection. A prototype has been developed to show its feasibility. The prototype consists of a low-power 2.4GHz LNA and a simple envelope detector, integrated in a 90nm CMOS technology. Post- layout simulation results are provided to verify the functionality of the approach. Copyright © 2011 IEEE.
DescripciónTrabajo presentado al "20 Asina Test Symposium" celebrado en Nueva Delhi (India) del 20 al 23 de Noviembre del 2011.-- Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the products or services of CSIC Spanish National Research Council, Digital.CSIC. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
Versión del editorhttp://dx.doi.org/10.1109/ATS.2011.15
URIhttp://hdl.handle.net/10261/45088
DOI10.1109/ATS.2011.15
ISBN978-1-4577-1984-4
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