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SiC Schottky Diodes for Harsh Environment Space Applications

AuthorsGodignon, Philippe; Jordà, Xavier; Vellvehi Hernández, Miquel; Perpiñà, X.; Banu, Viorel; López, Demetrio; Barbero, Juan; Brosselard, P.; Massetti, Silvia
Issue DateJul-2011
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Transactions on Industrial Electronics 58(7): 2582-2590 (2011)
AbstractThis paper reports on the fabrication technology and packaging strategy for 300-V 5-A silicon carbide Schottky diodes with a wide temperature operation range capability (between -170 °C and 300 °C). These diodes have been designed for harsh environment space applications such as inner Solar System exploration probes. Different endurance tests have been performed to evaluate the diode behavior when working at a high temperature and under severe thermal cycling conditions (ranged from -170 °C to 270 °C). The radiation hardness capability has been also tested. It has been found that the hermeticity of the package in a neutral atmosphere is a key aspect to avoid an electrical parameter drift. Moreover, the use of gold metallization and gold wire bonds on the anode allows reducing the diode surface and bonding degradation when compared to Al-containing technology. On the back-side cathode contact, the Ti/Ni/Au metallization and AuGe combination have shown a very good behavior. As a result, the manufactured diodes demonstrated high stability for a continuous operation at 285 °C.
Description9 páginas, 11 figuras, 4 tablas.
Publisher version (URL)http://dx.doi.org/10.1109/TIE.2010.2080252
Appears in Collections:(IMB-CNM) Artículos
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