Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/39211
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Título : A view of the implanted SiC damage by Rutherford backscattering spectroscopy, spectroscopic ellipsometry, and transmission electron microscopy
Autor : Battistig, Gabor, García López, J., Morilla, Yolanda
Palabras clave : SiC
Crystal structure
Transmission electron microscopy (TEM)
Rutherford backscattering spectrometry in channeling geometry (RBS/C)
Spectroscopic ellipsometry (SE)
High resolution electron microscopy (HREM)
Fecha de publicación : 3-Nov-2006
Editor: American Institute of Physics
Resumen: 4H-SiC single crystalline substrates were implanted at room temperature with 150 keV Al+ ions using fluences of 4×1014, 1×1015, and 2×1015 cm−2 with current density of 2.5 μA cm−2. The samples were subsequently annealed at 1100 °C in N2 for 1 h in order to analyze their structural recovery. The disorder induced in both sublattices by the Al+ ions was studied by backscattering spectrometry in channeling geometry with a 3.5 MeV He2+ beam. The results were compared with the optical properties of the samples measured by spectroscopic ellipsometry. In a previous work, we concluded that during the postimplantation annealing of a highly damaged SiC crystalline material the short distance order can be recovered, while the long distance disorder remains. We also presented the possibility to have grains of different polytypes oriented faraway from the original direction. Now, this alternative is confirmed by the cross-sectional transmission and high resolution electron microscopy studies, carried out to obtain information about the crystal structure.
Descripción : 5 páginas, 5 figuras, 1 tabla.-- et al.
Versión del editor: http://dx.doi.org/10.1063/1.2360150
URI : http://hdl.handle.net/10261/39211
ISSN: 0021-8979
DOI: 10.1063/1.2360150
Citación : Journal of Applied Physics 100(9): 093507 (2006)
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