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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/3845
Title: Selection of test techniques for high-resolution ΣΔ modulators
Authors: Guerra, Oscar; Escalera, Sara; Rosa, José M. de la; Compaigne, Eric; Galliard, Christophe; Rodríguez-Vázquez, Ángel
Keywords: Test
Sigma-Delta Modulators
Issue Date: Nov-2000
Citation: O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.
Abstract: This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.
URI: http://hdl.handle.net/10261/3845
ISBN: 2-9522971-0-X
Appears in Collections:(IMS-CNM) Comunicaciones congresos
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