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Open Access item Selection of test techniques for high-resolution ΣΔ modulators

Authors:Guerra, Oscar
Escalera, Sara
Rosa Utrera, José Manuel de la
Compaigne, Eric
Galliard, Christophe
Rodríguez Vázquez, Angel
Keywords:Test, Sigma-Delta Modulators
Issue Date:Nov-2000
Citation:O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.
Abstract:This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.
URI:http://hdl.handle.net/10261/3845
ISBN:2-9522971-0-X
Appears in Collections:(IMS-CNM) Comunicaciones congresos

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