Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/3845
Título : Selection of test techniques for high-resolution ΣΔ modulators
Autor : Guerra, Oscar, Escalera, Sara, Rosa, José M. de la, Compaigne, Eric, Galliard, Christophe, Rodríguez-Vázquez, Ángel
Palabras clave : Test
Sigma-Delta Modulators
Fecha de publicación : Nov-2000
Resumen: This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.
URI : http://hdl.handle.net/10261/3845
ISBN : 2-9522971-0-X
Citación : O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.
Appears in Collections:(IMS-CNM) Comunicaciones congresos

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