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| Título: | Selection of test techniques for high-resolution ΣΔ modulators |
Autor: | Guerra, Oscar CSIC; Escalera, Sara CSIC; Rosa, José M. de la CSIC ORCID; Compaigne, Eric; Galliard, Christophe; Rodríguez-Vázquez, Ángel CSIC ORCID | Palabras clave: | Test Sigma-Delta Modulators |
Fecha de publicación: | nov-2000 | Citación: | O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004. | Resumen: | This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. | URI: | http://hdl.handle.net/10261/3845 | ISBN: | 2-9522971-0-X |
| Aparece en las colecciones: | (IMSE-CNM) Comunicaciones congresos |
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| Fichero | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
| DCIS04c.pdf | 210,78 kB | Adobe PDF |  Visualizar/Abrir |
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