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|Title:||Selection of test techniques for high-resolution ΣΔ modulators|
|Authors:||Guerra, Oscar ; Escalera, Sara ; Rosa, José M. de la ; Compaigne, Eric; Galliard, Christophe; Rodríguez-Vázquez, Ángel|
|Citation:||O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.|
|Abstract:||This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.|
|Appears in Collections:||(IMS-CNM) Comunicaciones congresos|
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