English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/3794
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:


An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators

AuthorsEscalera, Sara ; García-González, José Manuel ; Guerra, Oscar ; Rosa, José M. de la ; Medeiro, Fernando ; Pérez-Verdú, Belén ; Rodríguez-Vázquez, Ángel
KeywordsDesign for Testability
Sigma-Delta Modulators
Issue DateMay-2004
PublisherInstitute of Electrical and Electronics Engineers
CitationS. Escalera, J.M. García-González, O. Guerra, J.M. de la Rosa, F. Medeiro, B. Pérez-Verdú and A. Rodríguez-Vázquez: "An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulator". Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS), pp. I.257-I.260, Vancouver, May 2004.
AbstractIn this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach.
Appears in Collections:(IMSE-CNM) Comunicaciones congresos
Files in This Item:
File Description SizeFormat 
ISCAS04c.pdf440,21 kBAdobe PDFThumbnail
Show full item record
Review this work

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.