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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/3794
Title: An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
Authors: Escalera, Sara ; García-González, José Manuel ; Guerra, Oscar ; Rosa, José M. de la ; Medeiro, Fernando ; Pérez-Verdú, Belén ; Rodríguez-Vázquez, Ángel
Keywords: Design for Testability
Sigma-Delta Modulators
Issue Date: May-2004
Publisher: Institute of Electrical and Electronics Engineers
Citation: S. Escalera, J.M. García-González, O. Guerra, J.M. de la Rosa, F. Medeiro, B. Pérez-Verdú and A. Rodríguez-Vázquez: "An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulator". Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS), pp. I.257-I.260, Vancouver, May 2004.
Abstract: In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach.
URI: http://hdl.handle.net/10261/3794
DOI: 0-7803-8251-X/04
Appears in Collections:(IMS-CNM) Comunicaciones congresos
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