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Open Access item An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators

Authors:Escalera, Sara
García-González, José Manuel
Guerra, Oscar
Rosa Utrera, José Manuel de la
Medeiro, Fernando
Pérez Verdú, Belén
Rodríguez Vázquez, Angel
Keywords:Design for Testability, Sigma-Delta Modulators
Issue Date:May-2004
Publisher:Institute of Electrical and Electronics Engineers
Citation:S. Escalera, J.M. García-González, O. Guerra, J.M. de la Rosa, F. Medeiro, B. Pérez-Verdú and A. Rodríguez-Vázquez: "An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulator". Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS), pp. I.257-I.260, Vancouver, May 2004.
Abstract:In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach.
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