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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/37193
Title: AFM characterization of small metallic nanoparticles
Authors: Carabías, I.; Venta, J. de la; Quesada, A.; García, M. A.; Kolodziejczyk, L.; Martínez de la Fuente, Jesús; Penadés, Soledad; Fernández-Camacho, A.; Crespo, Patricia; Hernando, Antonio
Keywords: Metallic nanoparticles
Issue Date: 2006
Publisher: Phantoms Foundation
Citation: E-nano Newsletter 4: 11-14 (2006)
Abstract: In this work, we present a detailed method to observe small metallic nanoparticles (size below 5 nm) with standard AFM equipment for users with a basic experience in AFM. We show that if the particles are well dispersed in a solution before deposition onto a substrate it is possible to image them individually by means of AFM. The particle size can also be measured from the images, considering the particle height, while the width is largely distorted by the tip geometry. Although AFM observations can not substitute HREM studies, they can be complementary as AFM allows observation of aggregation states, difficult to image by HREM, and the possibility of characterise the size of the protecting shell.
Description: 4 páginas, 6 figuras.
Publisher version (URL): http://www.phantomsnet.net/files/E_NANO_Newsletter_Issue04.pdf
URI: http://hdl.handle.net/10261/37193
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