Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/37193
Título : AFM characterization of small metallic nanoparticles
Autor : Carabías, I., Venta, J. de la, Quesada, A., García, M. A., Kolodziejczyk, L., Martínez de la Fuente, Jesús, Penadés, Soledad, Fernández-Camacho, A., Crespo, Patricia, Hernando, Antonio
Palabras clave : Metallic nanoparticles
AFM
HREM
Fecha de publicación : 2006
Editor: Phantoms Foundation
Resumen: In this work, we present a detailed method to observe small metallic nanoparticles (size below 5 nm) with standard AFM equipment for users with a basic experience in AFM. We show that if the particles are well dispersed in a solution before deposition onto a substrate it is possible to image them individually by means of AFM. The particle size can also be measured from the images, considering the particle height, while the width is largely distorted by the tip geometry. Although AFM observations can not substitute HREM studies, they can be complementary as AFM allows observation of aggregation states, difficult to image by HREM, and the possibility of characterise the size of the protecting shell.
Descripción : 4 páginas, 6 figuras.
Versión del editor: http://www.phantomsnet.net/files/E_NANO_Newsletter_Issue04.pdf
URI : http://hdl.handle.net/10261/37193
Citación : E-nano Newsletter 4: 11-14 (2006)
Appears in Collections:(IIQ) Artículos
(ICMS) Artículos

Files in This Item:
File Description SizeFormat 
AFM_2006.pdf1,63 MBAdobe PDFView/Open
Show full item record
 
CSIC SFX LinksSFX Query

Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.