Experimental evidence of the structure of annihilation of antiphase boundaries in GaAs on Si

Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/33828

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Title:	Experimental evidence of the structure of annihilation of antiphase boundaries in GaAs on Si
Authors:	Molina, Sergio I.; Aragón, G.; González Díez, Yolanda CSIC ORCID; González Sotos, Luisa CSIC ORCID ; Briones Fernández-Pola, Fernando CSIC; Ponce, F. A.; García, Rafael
Issue Date:	Jan-1993
Publisher:	Elsevier
Citation:	Materials Letters 15(5-6): 353-355 (1993)
Abstract:	A high-resolution electron microscopy (HREM) study on antiphase boundaries in GaAs grown on Si is presented. HREM images of two close antiphase boundaries appearing mainly on the {110} planes which abruptly disappear suggest some ideas on the mechanisms of annihilation of these defects.
Description:	3 páginas, 2 figuras.
Publisher version (URL):	http://dx.doi.org/10.1016/0167-577X(93)90094-E
URI:	http://hdl.handle.net/10261/33828
DOI:	10.1016/0167-577X(93)90094-E
ISSN:	0167-577X
Appears in Collections:	(IMN-CNM) Artículos

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