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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/33774
Title: Band Alignments in InxGa1–xP/GaAs Heterostructures Investigated by Pressure Experiments
Authors: Martínez-Pastor, Juan; Camacho, J.; Rudamas, C.; Cantarero, Andrés; González Sotos, Luisa ; Syassen, K.
Issue Date: Mar-2000
Publisher: Wiley-Blackwell
Citation: Physica Status Solidi A 178(1): 571-576 (2000)
Abstract: InxGa1—xP/GaAs (x = 0.541 and 0.427) heterostructures, grown by Atomic Layer Molecular Beam Epitaxy (ALMBE) on low temperature substrates, have been characterised by pressure-dependent and time-resolved photoluminescence experiments. The excitonic optical transitions and recombination dynamics are both influenced by the particular band alignments of these systems. The valence band offset has been found to have approximately the same absolute value (ΔEVB ≈ 380 meV), independent of the In content of the alloy in the barrier, whereas the conduction band offset varies appreciably depending on the alloy band gap. The huge valence band offset implies a strong asymmetry in the confinement of carriers, affecting the exciton recombination dynamics in the quantum wells.
Description: 6 páginas, 3 figuras.
Publisher version (URL): http://dx.doi.org/10.1002/1521-396X(200003)178:1<571::AID-PSSA571>3.0.CO;2-M
URI: http://hdl.handle.net/10261/33774
DOI: 10.1002/1521-396X(200003)178:1<571::AID-PSSA571>3.0.CO;2-M
ISSN: 0031-8965
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