Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/33720
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Título : Column-by-column compositional mapping by Z-contrast imaging
Autor : Molina, Sergio I., Sales, D. L., Galindo, P. L., Fuster, David, González Díez, Yolanda, Alén, Benito, González Sotos, Luisa, Varela, M., Pennycook, S. J.
Palabras clave : High-resolution electron microscopy
Z-contrast imaging
Compositional mapping
Fecha de publicación : Jan-2009
Editor: Elsevier
Citación : Ultramicroscopy 109(2): 172-176 (2009)
Resumen: A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates.
Descripción : 5 páginas, 3 fiugras, 1 tabla.-- PACS: 81.70.Jb; 61.16.Bg
Versión del editor: http://dx.doi.org/10.1016/j.ultramic.2008.10.008
URI : http://hdl.handle.net/10261/33720
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2008.10.008
Appears in Collections:(IMM-CNM) Artículos

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