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Closed Access item Column-by-column compositional mapping by Z-contrast imaging

Authors:Molina, Sergio I.
Sales, D. L.
Galindo, P. L.
Fuster, David
González, Yolanda
Alén, Benito
González, Luisa
Varela, M.
Pennycook, S. J.
Keywords:High-resolution electron microscopy, Z-contrast imaging, Compositional mapping
Issue Date:Jan-2009
Publisher:Elsevier
Citation:Ultramicroscopy 109(2): 172-176 (2009)
Abstract:A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates.
Description:5 páginas, 3 fiugras, 1 tabla.-- PACS: 81.70.Jb; 61.16.Bg
Publisher version (URL):http://dx.doi.org/10.1016/j.ultramic.2008.10.008
URI:http://hdl.handle.net/10261/33720
ISSN:0304-3991
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Appears in Collections:(IMM-CNM) Artículos

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