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Título

Column-by-column compositional mapping by Z-contrast imaging

AutorMolina, Sergio I.; Sales, David L.; Galindo, P. L.; Fuster, David CSIC ORCID ; González Díez, Yolanda CSIC ORCID; Alén, Benito CSIC ORCID; González Sotos, Luisa CSIC ORCID ; Varela, María; Pennycook, Stephen J.
Palabras claveHigh-resolution electron microscopy
Z-contrast imaging
Compositional mapping
Fecha de publicaciónene-2009
EditorElsevier
CitaciónUltramicroscopy 109(2): 172-176 (2009)
ResumenA phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates.
Descripción5 páginas, 3 fiugras, 1 tabla.-- PACS: 81.70.Jb; 61.16.Bg
Versión del editorhttp://dx.doi.org/10.1016/j.ultramic.2008.10.008
URIhttp://hdl.handle.net/10261/33720
DOI10.1016/j.ultramic.2008.10.008
ISSN0304-3991
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