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Título: | Column-by-column compositional mapping by Z-contrast imaging |
Autor: | Molina, Sergio I.; Sales, David L.; Galindo, P. L.; Fuster, David CSIC ORCID ; González Díez, Yolanda CSIC ORCID; Alén, Benito CSIC ORCID; González Sotos, Luisa CSIC ORCID ; Varela, María; Pennycook, Stephen J. | Palabras clave: | High-resolution electron microscopy Z-contrast imaging Compositional mapping |
Fecha de publicación: | ene-2009 | Editor: | Elsevier | Citación: | Ultramicroscopy 109(2): 172-176 (2009) | Resumen: | A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates. | Descripción: | 5 páginas, 3 fiugras, 1 tabla.-- PACS: 81.70.Jb; 61.16.Bg | Versión del editor: | http://dx.doi.org/10.1016/j.ultramic.2008.10.008 | URI: | http://hdl.handle.net/10261/33720 | DOI: | 10.1016/j.ultramic.2008.10.008 | ISSN: | 0304-3991 |
Aparece en las colecciones: | (IMN-CNM) Artículos |
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