English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/33720
Share/Impact:
Statistics
logo share SHARE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Title

Column-by-column compositional mapping by Z-contrast imaging

AuthorsMolina, Sergio I.; Sales, David L.; Galindo, P. L.; Fuster, David ; González Díez, Yolanda ; Alén, Benito ; González Sotos, Luisa ; Varela, María; Pennycook, Stephen J.
KeywordsHigh-resolution electron microscopy
Z-contrast imaging
Compositional mapping
Issue DateJan-2009
PublisherElsevier
CitationUltramicroscopy 109(2): 172-176 (2009)
AbstractA phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates.
Description5 páginas, 3 fiugras, 1 tabla.-- PACS: 81.70.Jb; 61.16.Bg
Publisher version (URL)http://dx.doi.org/10.1016/j.ultramic.2008.10.008
URIhttp://hdl.handle.net/10261/33720
DOI10.1016/j.ultramic.2008.10.008
ISSN0304-3991
Appears in Collections:(IMN-CNM) Artículos
Files in This Item:
There are no files associated with this item.
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.