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Title: | A BIST solution for frequency domain characterization of analog circuits |
Authors: | Barragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID | Keywords: | Analog BIST Signal Generator Frequency Response Characterization On-Chip Spectrum Analyzer On-Chip Network Analyzer |
Issue Date: | 2010 | Publisher: | Springer Nature | Citation: | Journal of Electronic Testing 26(4): 429–441 (2010) | Abstract: | This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated. | Description: | El pdf del artículo es la versión post-print. | Publisher version (URL): | http://dx.doi.org/10.1007/s10836-010-5158-7 | URI: | http://hdl.handle.net/10261/33220 | DOI: | 10.1007/s10836-010-5158-7 | ISSN: | 0923-8174 |
Appears in Collections: | (IMSE-CNM) Artículos |
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