Digital.CSIC > Ciencia y Tecnologías Físicas > Instituto de Microelectrónica de Sevilla (IMS-CNM) > (IMS-CNM) Artículos >




Open Access item A BIST solution for frequency domain characterization of analog circuits

Authors:Barragán, Manuel J.
Vázquez, Diego
Rueda, Adoración
Keywords:Analog BIST, Signal Generator, Frequency Response Characterization, On-Chip Spectrum Analyzer, On-Chip Network Analyzer
Issue Date:2010
Citation:Journal of Electronic Testing 26(4): 429–441 (2010)
Abstract:This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated.
Description:El pdf del artículo es la versión post-print.
Publisher version (URL):http://dx.doi.org/10.1007/s10836-010-5158-7
Appears in Collections:(IMS-CNM) Artículos

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.