Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/33220
Share/Impact:
Título : A BIST solution for frequency domain characterization of analog circuits
Autor : Barragán, Manuel J., Vázquez, Diego, Rueda, Adoración
Palabras clave : Analog BIST
Signal Generator
Frequency Response Characterization
On-Chip Spectrum Analyzer
On-Chip Network Analyzer
Fecha de publicación : 2010
Editor: Springer
Resumen: This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated.
Descripción : El pdf del artículo es la versión post-print.
Versión del editor: http://dx.doi.org/10.1007/s10836-010-5158-7
URI : http://hdl.handle.net/10261/33220
ISSN: 0923-8174
DOI: 10.1007/s10836-010-5158-7
Citación : Journal of Electronic Testing 26(4): 429–441 (2010)
Appears in Collections:(IMS-CNM) Artículos

Files in This Item:
File Description SizeFormat 
bist.pdf1,73 MBAdobe PDFView/Open
Show full item record
 
CSIC SFX LinksSFX Query


Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.