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Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures

AuthorsBarragán, Manuel J. ; Fiorelli, R. ; Léger, G. ; Rueda, Adoración ; Huertas-Díaz, J. L.
KeywordsRF test
Ensemble learning
Signature test
Issue Date6-Jan-2011
CitationJournal of Electronic Testing 27(3): 277-288 (2011)
AbstractThis paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the Device Under Test (DUT) to a two-tone input signal. The envelope signal is processed to obtain a digital signature sensitive to key specifications of the DUT. An optimized regression model based on ensemble learning is used to relate the digital signatures to the target specifications. A new Figure of Merit (FOM) is proposed to evaluate the prediction accuracy of the statistical model, and a demonstrator has been developed to prove the feasibility of the approach. This demonstrator features a 2.445 GHz low-power LNA and a simple envelope detector, and has been developed in a 90 nm CMOS technology. Post-layout simulations are provided to verify the functionality of the proposed test technique
DescriptionEl pdf del artículo es el manuscrito de autor.
Publisher version (URL)http://dx.doi.org/10.1007/s10836-010-5193-4
Appears in Collections:(IMSE-CNM) Artículos
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