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Open Access item Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures
|Authors:||Barragán, Manuel J.|
Huertas-Díaz, J. L.
|Keywords:||RF test, RF BIST, Ensemble learning, Signature test|
|Citation:||Journal of Electronic Testing 27(3): 277-288 (2011)|
|Abstract:||This paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the Device Under Test (DUT) to a two-tone input signal. The envelope signal is processed to obtain a digital signature sensitive to key specifications of the DUT. An optimized regression model based on ensemble learning is used to relate the digital signatures to the target specifications. A new Figure of Merit (FOM) is proposed to evaluate the prediction accuracy of the statistical model, and a demonstrator has been developed to prove the feasibility of the approach. This demonstrator features a 2.445 GHz low-power LNA and a simple envelope detector, and has been developed in a 90 nm CMOS technology. Post-layout simulations are provided to verify the functionality of the proposed test technique|
|Description:||El pdf del artículo es el manuscrito de autor.|
|Publisher version (URL):||http://dx.doi.org/10.1007/s10836-010-5193-4|
|Appears in Collections:||(IMS-CNM) Artículos|
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