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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/31085
Title: On-chip characterization of RF systems based on envelope response analysis
Authors: Barragán, Manuel J.; Fiorelli, R.; Vázquez, Diego; Rueda, Adoración; Huertas-Díaz, J. L.
Issue Date: Jan-2010
Publisher: Institution of Engineering and Technology
Citation: Electronics Letters 46(1): 36-38 (2010)
Abstract: A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment.
Description: 2 páginas, 2 figuras, 2 tablas.-- El pdf del artículo es la versión post-print.
Publisher version (URL): http://dx.doi.org/10.1049/el.2010.2644
URI: http://hdl.handle.net/10261/31085
ISSN: 0013-5194
DOI: 10.1049/el.2010.2644
Appears in Collections:(IMS-CNM) Artículos
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