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Open Access item On-chip characterization of RF systems based on envelope response analysis

Authors:Barragán, Manuel J.
Fiorelli, R.
Vázquez, Diego
Rueda, Adoración
Huertas-Díaz, J. L.
Issue Date:Jan-2010
Publisher:Institution of Engineering and Technology
Citation:Electronics Letters 46(1): 36-38 (2010)
Abstract:A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment.
Description:2 páginas, 2 figuras, 2 tablas.-- El pdf del artículo es la versión post-print.
Publisher version (URL):http://dx.doi.org/10.1049/el.2010.2644
URI:http://hdl.handle.net/10261/31085
ISSN:0013-5194
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Appears in Collections:(IMS-CNM) Artículos

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